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This work presents a semi-analytical approach to answer the question of optimal beam filtering in the case of EDXRF measurements with an X-ray tube. A collection of programs, called xfilter, is presented that is capable to find the optimal…

Instrumentation and Detectors · Physics 2020-01-29 Daniel Maier , Olivier Limousin , Diana Renaud , Francois Visticot

The current work describes a proof of concept of a 3D XRF scanner, which is able to perform elemental analysis over the cylindrical surface of geological rock-core and to reconstruct a 1D, 2D and a 3D elemental map of the scanned area. The…

Instrumentation and Detectors · Physics 2025-01-07 Alexandru Enciu

In a standard method of determining electron density for soft X-ray (SXR) flare kernels it is necessary to assume what is the extension of a kernel along the line of sight. This is a source of significant uncertainty of the obtained…

Solar and Stellar Astrophysics · Physics 2015-05-27 Jerzy Jakimiec , Urszula Bak-Steslicka

Dark Field X-ray Microscopy (DFXM) has advanced 3D non-destructive, high-resolution imaging of strain and orientation in crystalline materials, enabling the study of embedded structures in bulk. However, the photon-intensive nature of…

We present a new method to calculate fundamental Doppler measurement limits with a dispersed fixed-delay interferometer (DFDI) in the near infrared wavelength region for searching for exoplanets around M dwarfs in the coming decade. It is…

Earth and Planetary Astrophysics · Physics 2015-05-28 Ji Wang , Jian Ge , Peng Jiang , Bo Zhao

We present the design and implementation of a scanning probe microscope, which combines electrically detected magnetic resonance (EDMR) and (photo-)conductive atomic force microscopy ((p)cAFM). The integration of a 3-loop 2-gap X-band…

We demonstrate the feasibility of coincidence measurements in a conventional transmission electron microscope, revealing the temporal correlation between electron energy loss spectroscopy (EELS) and energy dispersive X-ray (EDX)…

Instrumentation and Detectors · Physics 2019-05-01 Daen Jannis , Knut Müller-Caspary , Armand Béché , Andreas Oelsner , Johan Verbeeck

We demonstrate that a common-line method can assemble a 3D oversampled diffracted intensity distribution suitable for high-resolution structure solution from a set of measured 2D diffraction patterns, as proposed in experiments with an…

Biomolecules · Quantitative Biology 2007-10-16 V. L. Shneerson , A. Ourmazd , D. K. Saldin

Detection of electron paramagnetic resonance (EPR) using a microwave cavity resonating at a fixed frequency (between 9 and 10 GHz) remains the most popular method until now. Here, we report a cavity-less technique which makes use of only an…

Applied Physics · Physics 2020-02-06 Ushnish Chaudhuri , R. Mahendiran

The values of the signal-to-noise ratio are determined, at which the method of processing X-ray diffraction data reveals reflections with intensity less than the noise component of the background. The possibilities of the method are…

A technique for measuring high-energy electrons using Si detectors of various thicknesses that are much smaller than the range of the examined electrons is presented. The advantages of the method are discussed on the basis of…

Instrumentation and Detectors · Physics 2024-02-27 Gokul Das H , R. Dubey , K. Czerski , M. Kaczmarski , A. Kowalska , N. Targosz-Sleczkaa , M. Valat

The Gas Pixel Detector belongs to the very limited class of gas detectors optimized for the measurement of X-ray polarization in the emission of astrophysical sources. The choice of the mixture in which X-ray photons are absorbed and…

Instrumentation and Methods for Astrophysics · Physics 2015-05-18 F. Muleri , P. Soffitta , L. Baldini , R. Bellazzini , A. Brez , E. Costa , S. Fabiani , F. Krummenacher , L. Latronico , F. Lazzarotto , M. Minuti , M. Pinchera , A. Rubini , C. Sgro , G. Spandre

Fabrication of semiconductor heterostructures is now so precise that metrology has become a key challenge for progress in science and applications. It is now relatively straightforward to characterize classic III-V and group IV…

In this article a topological sensitivity framework for far field detection of a diametrically small electromagnetic inclusion is established. The cases of single and multiple measurements of the electric far field scattering amplitude at a…

Numerical Analysis · Mathematics 2017-03-10 Abdul Wahab , Tasawar Abbas , Naveed Ahmed , Qazi Muhammad Zaigham Zia

We investigate the use of a split-ring resonator (SRR) incorporated with an atomic-vapor cell to improve the sensitivity and the minimal detectable electric (E) field of Rydberg atom-based sensors. In this approach, a sub-wavelength SRR is…

A new method for identifying crystalline phases in X-ray diffraction data has been proposed, which is especially useful for the study of multiphase materials (more than eight - ten phases) with a relatively low content (less than 1 - 3…

Materials Science · Physics 2021-08-17 A. D. Skorbun , S. V. Gabielkov , I. V. Zhyganiuk

The challenge of imaging low-density objects in an electron microscope without causing beam damage is significant in modern TEM. This is especially true for life science imaging, where the sample, rather than the instrument, still…

Optics · Physics 2025-01-29 Francisco Vega Ibáñez , Jo Verbeeck

Time-domain thermoreflectance (TDTR) and frequency-domain thermoreflectance (FDTR) have been widely used for non-contact measurement of anisotropic thermal conductivity of materials with high spatial resolution. However, the requirement of…

Applied Physics · Physics 2023-01-25 Jinchi Sun , Guangxin Lv , David G. Cahill

Controlled etching of copper electrodes in Gas Electron Multiplier foils allows a reduction of the material budget by more than a factor of two for a triple-GEM detector. Detectors making use of thinned foils provide performances similar to…

Instrumentation and Detectors · Physics 2008-11-26 A. Bondar , A. Buzulutskov , R. de Oliveira , L. Ropelewski , F. Sauli , L. Shekhtman