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This work discusses an extension to conventional low-coherence interferometry by the introduction of dispersion-encoding. The extension facilitates the measurement of surface height profiles with sub-nm resolution. The selection of a…

Optics · Physics 2021-05-24 Christopher Taudt

In this paper, we propose an x-ray fluorescence imaging system for elemental analysis. The key idea is what we call "x-ray fluorescence sectioning". Specifically, a slit collimator in front of an x-ray tube is used to shape x-rays into a…

Medical Physics · Physics 2012-10-29 Wenxiang Cong , Ge Wang

Rydberg-atom electric field sensing has shown great potential from near-DC to THz with state-of-the-art measurement metrics realized in sensitivity, phase extraction, multi-band receptivity, etc. While Rydberg-atom sensors have shown…

Quantum Physics · Physics 2026-03-17 Aveek Chandra , Narongrit Paensin , Rainer Dumke

Single-electron detectors are a key component of electron microscopes and advanced electron optics experiments. We present a YAG:Ce scintillator-based single-electron detector with a spatial resolution of 1 micrometer at an electron energy…

Instrumentation and Detectors · Physics 2025-10-07 Luis Alfredo Ixquiac Méndez , Martino Zanetti , Tilman Kraeft , Thomas Juffmann

High-throughput analysis of multidimensional transmission electron microscopy (TEM) datasets remains a significant challenge, limiting the broader impact on strategic materials research. Conventional workflows typically involve sequential,…

Materials Science · Physics 2025-07-16 Arda Genc , Ravit Silverstein

Electron diffraction through a thin patterned silicon membrane can be used to create complex spatial modulations in electron distributions by varying the intensity of different reflections using parameters such as crystallographic…

Accelerator Physics · Physics 2019-05-30 L. E. Malin , W. S. Graves , M. Holl , J. C. H. Spence , E. A. Nanni , R. K. Li , X. Shen , S. Weathersby

We conducted an inter-laboratory study of a metallic glass whose main component is nickel. Two determinations of the mass fractions of the different elements present within the sample were asked to the participants: one at an acceleration…

Materials Science · Physics 2015-09-02 Philippe Jonnard , François Brisset , Florence Robaut , Guillaume Wille , Jacky Ruste

Liquid xenon particle detectors rely on excellent light collection efficiency for their performance. This depends on the high reflectivity of polytetrafluoroethylene (PTFE) at the xenon scintillation wavelength of 178 nm, but the angular…

Instrumentation and Detectors · Physics 2020-03-31 S. Kravitz , R. J. Smith , L. Hagaman , E. P. Bernard , D. N. McKinsey , L. Rudd , L. Tvrznikova , G. D. Orebi Gann , M. Sakai

GaAsPN layers with a thickness of 30nm were grown on GaP substrates with metalorganic vapor phase epitaxy to study the feasibility of a single X-ray diffraction (XRD) measurement for full composition determination of quaternary layer…

Materials Science · Physics 2014-05-23 J. -M. Tilli , H. Jussila , K. M. Yu , T. Huhtio , M. Sopanen

A large number of current and future experiments in neutrino and dark matter detection use the scintillation light from noble elements as a mechanism for measuring energy deposition. The scintillation light from these elements is produced…

Instrumentation and Methods for Astrophysics · Physics 2015-03-19 V. M. Gehman , S. R. Seibert , K. Rielage , A. Hime , Y. Sun , D. -M. Mei , J. Maassen , D. Moore

We present a compact, cost-effective method for measuring the emittance of kHz-repetition-rate laser-wakefield accelerated electron beams using a permanent solenoid. The measured normalized emittance, $\epsilon_n = 124\,\mathrm{nm \cdot…

We present a simple 'shift-and-add' based improvement in the angular resolution of single electron backscatter diffraction (EBSD) patterns. Sub-pixel image registration is used to measure the (sub-pixel) difference in projection parameters…

Instrumentation and Detectors · Physics 2025-12-15 Ben Britton , Tianbi Zhang

Electron backscatter diffraction (EBSD) is a well-established method of characterisation for crystalline materials. This technique can rapidly acquire and index diffraction patterns to provide phase and orientation information about the…

Materials Science · Physics 2019-09-04 Alexander Foden , David Collins , Angus Wilkinson , Thomas Benjamin Britton

X-ray scattering spectra of Cu and Ni metals have been measured using monochromatic synchrotron radiation tuned from far above to more than 10 eV below threshold. Energy conservation in the scattering process is found to be sufficient to…

Materials Science · Physics 2012-01-04 M. Magnuson , J. -E. Rubensson , A. Föhlisch , N. Wassdahl , A. Nilsson , N. Mårtensson

The properties of semiconductors and functional dielectrics are defined by their response in electric fields, which may be perturbed by defects and the strain they generate. In this work, we demonstrate how diffraction-based X-ray…

Materials Science · Physics 2024-11-12 Trygve Magnus Ræder , Urko Petralanda , Thomas Olsen , Hugh Simons

Macro x-ray fluorescence (XRF) imaging of cultural heritage objects, while a popular non-invasive technique for providing elemental distribution maps, is a slow acquisition process in acquiring high signal-to-noise ratio XRF volumes.…

Image and Video Processing · Electrical Eng. & Systems 2022-06-07 Henry Chopp , Alicia McGeachy , Matthias Alfeld , Oliver Cossairt , Marc Walton , Aggelos Katsaggelos

The appearance of direct electron detectors marked a new era for electron diffraction. Their high sensitivity and low noise opens the possibility to extend electron diffraction from transmission electron microscopes (TEM) to lower energies…

Applied Physics · Physics 2025-02-18 Nikita Denisov , Andrey Orekhov , Johan Verbeeck

Devices made from two-dimensional (2D) materials such as graphene or transition metal dichalcogenides possess interesting electronic properties that can become accessible to experimental probes when the samples are protected from…

Mesoscale and Nanoscale Physics · Physics 2019-07-16 Michael A. Altvater , Tianhui Zhu , Guohong Li , Kenji Watanabe , Takashi Taniguchi , Eva Y. Andrei

Rydberg atoms have been used for measuring radio-frequency (RF) electric (E)-fields due to their strong dipole moments over the frequency range of 500 MHz-1 THz. For this, electromagnetically induced transparency (EIT) within the…

Rydberg atoms, which possess exceptionally large electric dipole moments, offer a promising route for electric field sensing as well as metrology traceable to the International System of Units (SI); however, current research predominantly…

Quantum Physics · Physics 2026-04-20 Tianyu Zhou , Haipeng Xie , Xin Wang