Related papers: Secondary Electron Count Imaging in SEM
Scanning Electron Microscopes (SEMs) are widely renowned for their ability to analyze the surface structures of microscopic objects, offering the capability to capture highly detailed, yet only grayscale, images. To create more expressive…
A new tool providing material contrast control in scanning electron microscopy (SEM) is demonstrated. The approach is based on deep-UV illumination during SEM imaging and delivers a novel material based contrast as well as higher resolution…
In this article, a new scanning electron microscopy (SEM) image composition technique is described, which can significantly reduce drift related image corruptions. Drift-distortion commonly causes blur and distortions in the SEM images.…
The scanning electron microscopy (SEM) is probably one the most fascinating examination approach that has been used since more than two decades to detailed inspection of micro scale objects. Most of the scanning electron microscopes could…
In a particle beam microscope, a raster-scanned focused beam of particles interacts with a sample to generate a secondary electron (SE) signal pixel by pixel. Conventionally formed micrographs are noisy because of limitations on acquisition…
A multi-imaging strategy is proposed and experimentally tested to improve the accuracy of photon counting with an electron multiplying charge-coupled device (EMCCD), by taking into account the random nature of its on-chip gain and the…
Scanning electron microscopy (SEM) is indispensable in diverse applications ranging from microelectronics to food processing because it provides large depth-of-field images with a resolution beyond the optical diffraction limit. However,…
Label-free optical microscopy through absorption or scattering spectroscopy provides fundamental insights across biology and materials science, yet its sensitivity remains fundamentally limited by photon shot noise. While recent…
In Environmental Scanning Electron Microscopy (ESEM) experiments, the acquisition parameters are generally kept constant throughout the collection of a data set. This limits data collection to one data set at a time, and frequent human…
Modeling artificial scanning electron microscope (SEM) and scanning ion microscope images has recently become important. This is because of the need to provide repeatable images with a priori determined parameters. Modeled artificial images…
While transmission electron microscopes (TEM) can achieve a much higher resolution than optical microscopes, they face challenges of damage to samples during the high energy processes involved. Here, we explore using computational ghost…
Conventional CCD detectors have two major disadvantages: they are slow to read out and they suffer from read noise. These problems combine to make high-speed spectroscopy of faint targets the most demanding of astronomical observations. It…
Electron channeling contrast imaging (ECCI) is a scanning electron microscopy (SEM) based technique that enables bulk-sample characterization of crystallographic defects (e.g. dislocations, stacking faults, low angle boundaries). Despite…
Characterisation of rare microstructural features in scanning electron microscopy (SEM) requires imaging large areas at high resolution. This leads to prohibitively long acquisition times. We present an open-source Python framework that…
The dynamics of photo-excited charge carriers, particularly their transport and interactions with defects and interfaces, play an essential role in determining the performance of a wide range of solar and optoelectronic devices. A thorough…
We study the increase of image noise which can be observed in images reconstructed with the OSEM algorithm. We argue that the excessive noise is equivalent to shortening scanning time by a factor of 2 or more at high number of subsets…
Electron microscopy (EM) is a foundational tool for directly assessing the structure of materials. Recent advances in direct electron detectors have improved signal-to noise ratios via single-electron counting. However, accurately counting…
Purpose: Spectral imaging is a method in medical x-ray imaging to extract information about the object constituents by the material-specific energy dependence of x-ray attenuation. The authors have investigated a photon-counting spectral…
Scanning Transmission Electron Microscopy (STEM) offers high-resolution images that are used to quantify the nanoscale atomic structure and composition of materials and biological specimens. In many cases, however, the resolution is limited…
The performance of a particle accelerator can be limited by the build-up of an electron cloud (EC) in the vacuum chamber. Secondary electron emission from the chamber walls can contribute to EC growth. An apparatus for in-situ measurements…