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Recent progress in phase modulation using nanofabricated electron holograms has demonstrated how the phase of an electron beam can be controlled. In this paper, we apply this concept to the correction of spherical aberration in a scanning…

We present an objective method to remove the stellar continuum emission from narrow-band images to derive emission-line images. The method is based on the skewness of the pixel histogram of the residual images. Specifically, we exploit a…

Instrumentation and Methods for Astrophysics · Physics 2015-06-17 Sungryong Hong , Daniela Calzetti , Mark Dickinson

Focused ion beam (FIB) microscopy suffers from source shot noise - random variation in the number of incident ions in any fixed dwell time - along with random variation in the number of detected secondary electrons per incident ion. This…

Materials Science · Physics 2026-03-12 Minxu Peng , John Murray-Bruce , Karl K. Berggren , Vivek K Goyal

Ultra low radiation dose in X-ray Computed Tomography (CT) is an important clinical objective in order to minimize the risk of carcinogenesis. Compressed Sensing (CS) enables significant reductions in radiation dose to be achieved by…

LHC upgrades are being considered both towards higher luminosity (HL-LHC) and towards higher energy (HE-LHC). In this paper we report initial studies of the beam-beam effects in the HE-LHC [1]. The HE-LHC aims at beam energies of 16.5 TeV,…

Accelerator Physics · Physics 2011-08-10 K. Ohmi , O. Dominguez , F. Zimmermann

Linear phase-contrast scanning transmission electron microscopy (STEM) techniques compatible with high-throughput 4D-STEM acquisition are widely used to enhance phase contrast in weakly scattering and beam-sensitive materials. In these…

Particle beam microscopy uses a scanning beam of charged particles to create images of samples, and the quality of image reconstruction suffers when this beam current varies over time. Neither conventional reconstruction methods nor…

Image and Video Processing · Electrical Eng. & Systems 2021-06-10 Luisa Watkins

We employ electrostatic conversion drift calculations to match CCD pixel signal covariances observed in flat field exposures acquired using candidate sensor devices for the LSST Camera. We thus constrain pixel geometry distortions present…

In this work, non-destructive virtual diagnostics are applied to retrieve the electron beam time of arrival and energy in a relativistic ultrafast electron diffraction (UED) beamline using independently-measured machine parameters. This…

Scanning Transmission Electron Microscopy (STEM) enables the observation of atomic arrangements at sub-angstrom resolution, allowing for atomically resolved analysis of the physical and chemical properties of materials. However, due to the…

Computer Vision and Pattern Recognition · Computer Science 2025-04-04 Hesong Li , Ziqi Wu , Ruiwen Shao , Tao Zhang , Ying Fu

2D and 4D transverse phase-space of a low-energy ion-beam is measured with two of the most common emittance scanners. The article covers the description of the installation, the setup, the settings, the experiment and the benchmark of the…

Accelerator Physics · Physics 2023-01-25 F Osswald , T Durand , M Heine , J Michaud , F Poirier , J C Thomas , E Traykov

Automated experiments in scanning transmission electron microscopy (STEM) require rapid image segmentation to optimize data representation for human interpretation, decision-making, site-selective spectroscopies, and atomic manipulation.…

Materials Science · Physics 2024-09-23 Kamyar Barakati , Utkarsh Pratiush , Austin C. Houston , Gerd Duscher , Sergei V. Kalinin

Electron microscopy has enabled many scientific breakthroughs across multiple fields. A key challenge is the tuning of microscope parameters based on images to overcome optical aberrations that deteriorate image quality. This calibration…

Computer Vision and Pattern Recognition · Computer Science 2026-03-20 Jilles S. van Hulst , W. P. M. H. Heemels , Duarte J. Antunes

Electron tomography is a widely used technique for 3D structural analysis of nanomaterials, but it can cause damage to samples due to high electron doses and long exposure times. To minimize such damage, researchers often reduce beam…

Image and Video Processing · Electrical Eng. & Systems 2023-04-05 Timothy M. Craig , Ajinkya A Kadu , Kees Joost Batenburg , Sara Bals

A real-time image reconstruction method for scanning transmission electron microscopy (STEM) is proposed. With an algorithm requiring only the center of mass (COM) of the diffraction pattern at one probe position at a time, it is able to…

Materials Science · Physics 2021-12-15 Chu-Ping Yu , Thomas Friedrich , Daen Jannis , Sandra Van Aert , Johan Verbeeck

Weak gravitational lensing simulations serve as indispensable tools for obtaining precise cosmological constraints. In particular, it is crucial to address the systematic uncertainties in theoretical predictions, given the rapid increase in…

Cosmology and Nongalactic Astrophysics · Physics 2024-10-02 Zhao Chen , Yu Yu

In the current paper we consider the Helical Cone Beam CT. This scanning method exposes the patient to large quantities of radiation and results in very large amounts of data being collected and stored. Both these facts are prime motivators…

Information Theory · Computer Science 2016-02-11 Tamir Bendory , Arie Feuer

Microscopy is one of the most essential imaging techniques in life sciences. High-quality images are required in order to solve (potentially life-saving) biomedical research problems. Many microscopy techniques do not achieve sufficient…

Computer Vision and Pattern Recognition · Computer Science 2018-10-24 Joris Roels , Jan Aelterman , Jonas De Vylder , Hiep Luong , Yvan Saeys , Wilfried Philips

Transmission electron microscopy (TEM) is carried out in vacuum to minimize the interaction of the imaging electrons with gas molecules while passing through the microscope column. Nevertheless, in typical devices, the pressure remains at…

Mesoscale and Nanoscale Physics · Physics 2019-01-25 Gregor T. Leuthner , Stefan Hummel , Clemens Mangler , Timothy J. Pennycook , Toma Susi , Jannik C. Meyer , Jani Kotakoski

Scanning transmission electron microscopy (STEM) has become the technique of choice for quantitative characterization of atomic structure of materials, where the minute displacements of atomic columns from high-symmetry positions can be…

Materials Science · Physics 2021-10-05 Kevin M. Roccapriore , Nicole Creange , Maxim Ziatdinov , Sergei V. Kalinin