Related papers: Time-Resolved Focused Ion Beam Microscopy: Modelin…
The Facility for Rare Isotope Beams (FRIB) delivers a wide variety of rare isotopes as fast, stopped, or reaccelerated beams to enable forefront research in nuclear structure, astrophysics, and fundamental interactions. To expand the…
Atom probe tomography (APT) helps elucidate the link between the nanoscale chemical variations and physical properties, but it has limited structural resolution. Field ion microscopy (FIM), a predecessor technique to APT, is capable of…
In modern high-gain free-electron lasers, ultra-fast photon pulses designed for studying chemical, atomic and biological systems are generated from a serial of behaviors of high-brightness electron beam at the time-scale ranging from…
A photoelectron forced to pass through two atomic energy levels before receding from the residual ion shows interference fringes in its angular distribution as manifestation of a two-slit-type interference experiment in wave-vector space.…
Nanoscale fabrication and characterisation techniques critically underpin a vast range of fields, including materials science, nanoelectronics and nanobiotechnology. Focused ion beam (FIB) techniques are particularly appealing due to their…
We present an experimental demonstration of a single-shot, non-destructive electron beam diagnostic based on the ionization of a low-density pulsed gas jet. In our study, 7~MeV electron bunches from a radio frequency (RF) photoinjector,…
We demonstrate bipartite gaussian boson sampling with squeezed light in 6 mixed time-frequency modes. Non-degenerate two-mode squeezing is generated in two time-bins from a silicon nitride microresonator with simultaneous high spectral…
Interaction-free measurement (IFM) has been proposed as a means of high-resolution, low-damage imaging of radiation-sensitive samples, such as biomolecules and proteins. The basic setup for IFM is a Mach-Zehnder interferometer, and recent…
Pushing the limits in temporal resolution for transmission electron microscopy (TEM) requires a revolutionary change in the electron source technology. In this paper we study the possibility of employing a radiofrequency photoinjector as…
We demonstrate that a near-field microwave microscope based on a transmission line resonator allows imaging in a substantially wide range of frequencies, so that the microscope properties approach those of a spatially-resolved impedance…
We demonstrate a new focused ion beam sample preparation method for atom probe tomography. The key aspect of the new method is that we use a neon ion beam for the final tip-shaping after conventional annulus milling using gallium ions. This…
The time-resolved electron beam envelope parameters including sectional distribution and position are important and necessary for the study of beam transmission characteristics in the magnetic field and verifying the magnetic field setup…
In the present work we report about a parallel-processing ion beam fabrication technique whereby high-density sub-superficial graphitic microstructures can be created in diamond. Ion beam implantation is an effective tool for the structural…
Attosecond pulses, produced through high-order harmonic generation in gases, have been successfully used for observing ultrafast, sub-femtosecond electron dynamics in atoms, molecules and solid state systems. Today's typical attosecond…
We present a widefield fluorescence microscope that integrates an event-based image sensor (EBIS) with a CMOS image sensor (CIS) for ultra-fast microscopy with spectral distinction capabilities. The EBIS achieves temporal resolution of…
We propose a new microscopy simulation system that can depict atomistic models in a micrograph visual style, similar to results of physical electron microscopy imaging. This system is scalable, able to represent simulation of electron…
Sample-induced image-degradation remains an intricate wave-optical problem in light-sheet microscopy. Here we present biobeam, an open-source software package that enables to simulate operational light-sheet microscopes by combining data…
Focused ion beam (FIB) techniques are employed widely for nanofabrication, and processing of materials and devices. However, ion irradiation often gives rise to severe damage due to atomic displacements that cause defect formation,…
Feynman once asked physicists to build better electron microscopes to be able to watch biology at work. While electron microscopes can now provide atomic resolution, electron beam induced specimen damage precludes high resolution imaging of…
Single-pixel imaging, originally developed in light optics, facilitates fast three-dimensional sample reconstruction, as well as probing with light wavelengths undetectable by conventional multi-pixel detectors. However, the spatial…