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Related papers: Time-Resolved Focused Ion Beam Microscopy: Modelin…

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Direct electron detection is currently revolutionizing many fields of electron microscopy due to its lower noise, its reduced point-spread function, and its increased quantum efficiency. More specifically to this work, Timepix3 is a…

Instrumentation and Detectors · Physics 2023-12-21 Yves Auad , Jassem Baaboura , Jean-Denis Blazit , Marcel Tencé , Odile Stéphan , Mathieu Kociak , Luiz H. G. Tizei

We propose a new model-free segmentation method for idealizing ion channel recordings. This method is designed to deal with heterogeneity of measurement errors. This in particular applies to open channel noise which, in general, is…

Methodology · Statistics 2020-08-07 Florian Pein , Annika Bartsch , Claudia Steinem , Axel Munk

Secondary electron (SE) imaging techniques, such as scanning electron microscopy and helium ion microscopy (HIM), use electrons emitted by a sample in response to a focused beam of charged particles incident at a grid of raster scan…

Signal Processing · Electrical Eng. & Systems 2026-03-12 Vaibhav Choudhary , Akshay Agarwal , Vivek K Goyal

We demonstrate a prototype of a Focused Ion Beam machine based on the ionization of a laser-cooled cesium beam adapted for imaging and modifying different surfaces in the few-tens nanometer range. Efficient atomic ionization is obtained by…

Mesoscale and Nanoscale Physics · Physics 2016-01-08 M. Viteau , M. Reveillard , L. Kime , B. Rasser , P. Sudraud , Y. Bruneau , G. Khalili , P. Pillet , D. Comparat , I. Guerri , A. Fioretti , D. Ciampini , M. Allegrini , F. Fuso

Direct electron detection is revolutionizing electron microscopy by offering lower noise, reduced point-spread function, and increased quantum efficiency. Among these advancements, the Timepix3 hybrid-pixel direct electron detector stands…

We realize a single particle microscope by using deterministically extracted laser cooled $^{40}$Ca$^+$ ions from a Paul trap as probe particles for transmission imaging. We demonstrate focusing of the ions with a resolution of…

Traditional image acquisition for cryo focused ion-beam scanning electron microscopy tomography often sees thousands of images being captured over a period of many hours, with immense data sets being produced. When imaging beam sensitive…

Fiber-integrated micro-optical elements promise a scalable approach to photon collection and beam shaping for quantum information processing. Here, we demonstrate single-step fabrication of micro-spherical, micro-spiral, and micro-axicon…

Optics · Physics 2026-04-21 Raman Kumar , Sebastian Will

This paper reports on the fabrication and characterization of a high purity monocrystalline diamond detector with buried electrodes realized by the selective damage induced by a focused 6 MeV carbon ion beam scanned over a pattern defined…

Instrumentation and Detectors · Physics 2016-08-30 P. Olivero , J. Forneris , M. Jaksic , Z. Pastuovic , F. Picollo , N. Skukan , E. Vittone

Recent progress in laser-based high-repetition rate extreme ultraviolet (EUV) lightsources and multidimensional photoelectron spectroscopy enable the build-up of a new generation of time-resolved photoemission experiments. Here, we present…

Time-resolved atom interferometry, as employed in applications such as gravitational wave detection and searches for ultra-light dark matter, requires precise control over systematic effects. In this work, we investigate phase noise arising…

Atomic Physics · Physics 2025-11-25 Noam Mouelle , Jeremiah Mitchell , Valerie Gibson , Ulrich Schneider

Insight in the structure of nanoparticle assemblies up to a single particle level is key to understand the collective properties of these assemblies, which critically depend on the individual particle positions and orientations. However,…

The development of ultra-short intense laser sources in the visible and extreme ultraviolet (XUV) spectral range led to fascinating studies in laser-matter interactions and attosecond science. In the majority of these studies the system…

A beam imaging detector was developed by coupling a multi-strip anode with delay line readout to an E$\times$B microchannel plate (MCP) detector. This detector is capable of measuring the incident position of the beam particles in…

Instrumentation and Detectors · Physics 2017-09-20 B. B. Wiggins , Varinderjit Singh , J. Vadas , J. Huston , T. K. Steinbach , S. Hudan , R. T. deSouza

Focused ion beam (FIB) tomography provides high resolution volumetric images on a micro scale. However, due to the physical acquisition process the resulting images are often corrupted by a so-called curtaining or waterfall effect. In this…

Numerical Analysis · Mathematics 2016-04-06 Jan Henrik Fitschen , Jianwei Ma , Sebastian Schuff

A fast-reading current integrator is developed for high time-resolution and low-noise ion beam diagnostics under both continuous-wave and pulsed operating conditions. The system combines a low-leakage transimpedance front-end with a hybrid…

Instrumentation and Detectors · Physics 2026-04-01 I-Chun Cho , Chien-Hsu Chen , Huan Niu , Cheng-Ya Pan , Chun-Hui Hsing , Tung-Yuan Hsiao

This study explores the excitation and ionization of an atomic beam as a pathway to optimize focused ion beams (FIBs) for high-precision applications. Leveraging the unique advantages of Rydberg excitation followed by field ionization --…

Instruments to visualize transient structural changes of inhomogeneous materials on the nanometer scale with atomic spatial and temporal resolution are demanded to advance materials science, bioscience, and fusion sciences. One such…

Accelerator Physics · Physics 2017-03-20 X. Shen , R. K. Li , U. Lundström , T. J. Lane , A. H. Reid , S. P. Weathersby , X. J. Wang

Focused ion beam irradiation of metastable Fe$_{78}$Ni$_{22}$ thin films grown on Cu(100) substrates is used to create ferromagnetic, body-centered-cubic patterns embedded into paramagnetic, face-centered-cubic surrounding. The structural…

Field ion microscopy (FIM) allows to image individual surface atoms by exploiting the effect of an intense electric field. Widespread use of atomic resolution imaging by FIM has been hampered by a lack of efficient image processing/data…