Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams
Abstract
We present an experimental demonstration of a single-shot, non-destructive electron beam diagnostic based on the ionization of a low-density pulsed gas jet. In our study, 7~MeV electron bunches from a radio frequency (RF) photoinjector, carrying up to 100 pC of charge, traversed a localized distribution of nitrogen gas (N). The interaction of the electron bunches with the N gas generated a correlated signature in the ionized particle distribution, which was spatially magnified using a series of electrostatic lenses and recorded with a micro-channel-plate detector. Various modalities, including point-to-point imaging and velocity mapping, are investigated. A temporal trace of the detector current enabled the identification of single- and double-ionization events. The characteristics of the ionization distribution, dependence on gas density, total bunch charge, and other parameters, are described. Approaches to scaling to higher electron bunch density and energy are suggested. Additionally, the instrument proves useful for comprehensive studies of the ionization process itself.
Keywords
Cite
@article{arxiv.2411.15460,
title = {Single-Shot Ionization-Based Transverse Profile Monitor for Pulsed Electron Beams},
author = {Paul Denham and Alex Ody and Pietro Musumeci and Nathan Burger and Nathan Cook and Gerard Andonian},
journal= {arXiv preprint arXiv:2411.15460},
year = {2024}
}
Comments
Phys. Rev. Applied - Accepted 7 November, 2024