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Here a new microscopic method is proposed to image and characterize very thin samples like few-layer materials, organic molecules, and nanostructures with nanometer or sub-nanometer resolution using electron beams of energies lower than 20…

Instrumentation and Detectors · Physics 2016-01-06 Ing-Shouh Hwang

Electron tomography is a technique used in both materials science and structural biology to image features well below optical resolution limit. In this work, we present a new algorithm for reconstructing the three-dimensional(3D)…

Signal Processing · Electrical Eng. & Systems 2018-07-12 David Ren , Michael Chen , Laura Waller , Colin Ophus

Scanning Transmission Electron Microscopy (STEM) has become the main stay for materials characterization on atomic level, with applications ranging from visualization of localized and extended defects to mapping order parameter fields. In…

Instrumentation and Detectors · Physics 2019-01-15 Xin Li , Ondrej Dyck , Sergei V. Kalinin , Stephen Jesse

Single particle cryo-electron microscopy (EM) is an increasingly popular method for determining the 3-D structure of macromolecules from noisy 2-D images of single macromolecules whose orientations and positions are random and unknown. One…

Computer Vision and Pattern Recognition · Computer Science 2017-04-11 Roy R. Lederman , Amit Singer

In this study we explore the possibility to use deep learning for the reconstruction of phase images from 4D scanning transmission electron microscopy (4D-STEM) data. The process can be divided into two main steps. First, the complex…

Materials Science · Physics 2023-02-15 Thomas Friedrich , Chu-Ping Yu , Jo Verbeeck , Sandra Van Aert

We explore the possibility for the reconstruction of the generative physical models describing interactions between atomic units in solids from observational electron microscopy data. Here, scanning transmission electron microscopy (STEM)…

Materials Science · Physics 2021-02-02 M. Chakraborty , M. Ziatdinov , O. Dyck , S. Jesse , A. D. White , S. V. Kalinin

Three-dimensional atomic resolution imaging using transmission electron microscopes is a unique capability that requires challenging experiments. Linear electron tomography methods are limited by the missing wedge effect, requiring a high…

Computational Physics · Physics 2024-07-30 Shengboy You , Andrey Romanov , Philipp Pelz

In photon upconverting core-shell nanoparticles, structure strongly dictates performance. Conventional imaging in scanning transmission electron microscopy has sufficient resolution to probe the atomic structure of these nanoparticles, but…

While electron microscopy offers crucial atomic-resolution insights into structure-property relationships, radiation damage severely limits its use on beam-sensitive materials like proteins and 2D materials. To overcome this challenge, we…

Computer Vision and Pattern Recognition · Computer Science 2025-07-18 Zifei Wang , Zian Mao , Xiaoya He , Xi Huang , Haoran Zhang , Chun Cheng , Shufen Chu , Tingzheng Hou , Xiaoqin Zeng , Yujun Xie

This paper discusses the reconstruction of partially sampled spectrum-images to accelerate the acquisition in scanning transmission electron microscopy (STEM). The problem of image reconstruction has been widely considered in the literature…

Image and Video Processing · Electrical Eng. & Systems 2020-02-05 Etienne Monier , Thomas Oberlin , Nathalie Brun , Xiaoyan Li , Marcel Tencé , Nicolas Dobigeon

Transmission electron microscopy (TEM) is a powerful imaging tool that has found broad application in materials science, nanoscience and biology(1-3). With the introduction of aberration-corrected electron lenses, both the spatial…

Tailoring nanoparticles composition and morphology is of particular interest for improving their performance for catalysis. A challenge of this approach is that the nanoparticles optimized initial structure often changes during use.…

We introduce a denoising method for four-dimensional scanning transmission electron microscopy (4D-STEM) that relies on processing local, scan position-independent electron event-sparse data stacks, called event-sparse stack denoising. This…

Medical Physics · Physics 2025-12-12 Gregory Nordahl , Rebekka Klemmt , Espen Drath Bøjesen

Scanning transmission electron microscopy (STEM) has been extensively used for imaging complex materials down to atomic resolution. The most commonly employed STEM modality, annular dark-field imaging, produces easily-interpretable…

Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a…

We introduce the EMC algorithm for reconstructing a particle's 3D diffraction intensity from very many photon shot-noise limited 2D measurements, when the particle orientation in each measurement is unknown. The algorithm combines a…

Data Analysis, Statistics and Probability · Physics 2010-03-04 Duane Ne-Te Loh , Veit Elser

Hyperspectral neutron computed tomography enables 3D non-destructive imaging of the spectral characteristics of materials. In traditional hyperspectral reconstruction, the data for each neutron wavelength bin is reconstructed separately.…

Real-space imaging of three-dimensional atomic structures is a critical yet challenging task in materials science. Although scanning transmission electron microscopy has achieved sub-angstrom lateral resolution through techniques like…

Four-dimensional scanning transmission electron microscopy (4D-STEM) is a powerful tool that allows for the simultaneous acquisition of spatial and diffraction information, driven by recent advancements in direct electron detector…

Materials Science · Physics 2024-10-23 Ujjval Bansal , Amit Sharma , Barbara Putz , Christoph Kirchlechner , Subin Lee

Single particle cryo-electron microscopy is a vital tool for 3D characterization of protein structures. A typical workflow involves acquiring projection images of a collection of randomly oriented particles, picking and classifying…

Image and Video Processing · Electrical Eng. & Systems 2021-03-22 S. V. Venkatakrishnan , Puneet Juneja , Hugh O'Neill