Related papers: An atomic force microscope integrated with a heliu…
Imaging dynamical processes at interfaces and on the nanoscale is of great importance throughout science and technology. While light-optical imaging techniques often cannot provide the necessary spatial resolution, electron-optical…
We demonstrate a cryogenic scanned probe microscope (SPM) that has been modified to be controlled with a haptic device, such that the operator can `feel' the surface of a sample under investigation. This system allows for direct tactile…
Moving nanoparticles/atoms to study the nearfield interaction between them is one of the many approaches to explore the optical and electrical properties of these assemblies. Traditional approach included the self assembly by spinning or…
In this article, we present a deflection measurement setup for Atomic Force Microscopy (AFM). It is based on a quadrature phase differential interferometer: we measure the optical path difference between a laser beam reflecting above the…
The Probe-Particle Model combine theories designed for the simulation of scanning probe microscopy experiments, employing non-reactive, flexible tip apices to achieve sub-molecular resolution. In the article we present the latest version of…
Heat-assisted magnetic recording (HAMR) is a recent advancement in magnetic recording, allowing to significantly increase the areal density capability (ADC) of hard disk drives (HDDs) compared to the perpendicular magnetic recording (PMR)…
Scanning probe microscopy using nitrogen vacancy (NV) centers in diamond has become a versatile tool with applications in physics, chemistry, life sciences and earth and planetary sciences. However, the fabrication of diamond scanning…
The Photonic Force Microscope (PFM) is an opto-mechanical technique based on an optical trap that can be assumed to probe forces in microscopic systems. This technique has been used to measure forces in the range of pico- and femto-Newton,…
The aim of this paper is to deal with multi-physics simulation of micro-electro-mechanical systems (MEMS) based on an advanced numerical methodology. MEMS are very small devices in which electric as well as mechanical and fluid phenomena…
A numerical analysis of the origin of the atomic-scale contrast in Kelvin probe force microscopy (KPFM) is presented. Atomistic simulations of the tip-sample interaction force field have been combined with a non-contact Atomic Force…
We propose a scanning magnetic microscope which has a photoluminescence nanoprobe implanted in the tip of an AFM or STM, or NSOM, and exhibits optically detected magnetic resonance (ODMR). The proposed spin microscope has nanoscale lateral…
Atomic force spectroscopy and microscopy (AFM) are invaluable tools to characterize nanostructures and biological systems. Most experiments, including state-of-the-art images of molecular bonds, are achieved by driving probes at their…
A novel atomistic-continuum method (ACM) based on finite element method (FEM) is proposed to numerically simulate the nano-scaled Poisson's ratio and Young's modulus effect of Lithium (Li) body-centered cubic (BCC) structure. The potential…
Many emerging applications in microscale engineering rely on the fabrication of three-dimensional architectures in inorganic materials. Small-scale additive manufacturing (AM) aspires to provide flexible and facile access to these…
The interaction of Na atoms with a surface was probed by inserting a nanofabricated material grating into one arm of an atom interferometer (IFM). This technique permits a direct measurement of the change in phase and coherence of matter…
Light-field microscopy (LFM) is a 3D microscopy technique whereby volumetric information of a sample is gained by simultaneously capturing both the position and momentum (angular) information of light illuminating a scene. Conventional LFM…
We present an alternative approach to pump-probe spectroscopy for measuring fast charge dynamics with an atomic force microscope (AFM). Our approach is based on coherent multifrequency lock-in measurement of the intermodulation between a…
Scanning Thermal Microscopy (SThM) has become an important measurement tool for characterizing the thermal properties of materials at the nanometer scale. This technique requires a SThM probe that combines an Atomic Force Microscopy (AFM)…
Ultrasound Atomic Force Microscopy (US-AFM) has been used for subsurface imaging of nanostructures. The contact stiffness variations have been suggested as the origin of the image contrast. Therefore, to analyze the image contrast, the…
Scattering scanning near-field optical microscopy (s-SNOM) is a technique to enhance the spatial resolution, and when combined by Fourier transform spectroscopy it can provide spectroscopic information with high spatial resolution. This…