English

Metals by micro-scale additive manufacturing: comparison of microstructure and mechanical properties

Materials Science 2020-08-27 v1

Abstract

Many emerging applications in microscale engineering rely on the fabrication of three-dimensional architectures in inorganic materials. Small-scale additive manufacturing (AM) aspires to provide flexible and facile access to these geometries. Yet, the synthesis of device-grade inorganic materials is still a key challenge towards the implementation of AM in microfabrication. Here, we present a comprehensive overview of the microstructural and mechanical properties of metals fabricated by most state-of-the-art AM methods that offer a spatial resolution \leq10μ\mum. Standardized sets of samples were studied by cross-sectional electron microscopy, nanoindentation and microcompression. We show that current microscale AM techniques synthesize metals with a wide range of microstructures and elastic and plastic properties, including materials of dense and crystalline microstructure with excellent mechanical properties that compare well to those of thin-film nanocrystalline materials. The large variation in materials performance can be related to the individual microstructure, which in turn is coupled to the various physico-chemical principles exploited by the different printing methods. The study provides practical guidelines for users of small-scale additive methods and establishes a baseline for the future optimization of the properties of printed metallic objects - a significant step towards the potential establishment of AM techniques in microfabrication.

Keywords

Cite

@article{arxiv.1912.03581,
  title  = {Metals by micro-scale additive manufacturing: comparison of microstructure and mechanical properties},
  author = {Alain Reiser and Lukas Koch and Kathleen A. Dunn and Toshiki Matsuura and Futoshi Iwata and Ofer Fogel and Zvi Kotler and Nanjia Zhou and Kristin Charipar and Alberto Piqué and Patrik Rohner and Dimos Poulikakos and Sanghyeon Lee and Seung K. Seol and Ivo Utke and Cathelijn van Nisselroy and Tomaso Zambelli and Jeffrey M. Wheeler and Ralph Spolenak},
  journal= {arXiv preprint arXiv:1912.03581},
  year   = {2020}
}