Related papers: Development of High-Speed Ion Conductance Microsco…
Structured illumination microscopy (SIM) improves resolution by down-modulating high-frequency information of an object to fit within the passband of the optical system. Generally, the reconstruction process requires prior knowledge of the…
Modeling artificial scanning electron microscope (SEM) and scanning ion microscope images has recently become important. This is because of the need to provide repeatable images with a priori determined parameters. Modeled artificial images…
Over the past decade, structured illumination microscopy (SIM) has found its niche in super-resolution (SR) microscopy due to its fast imaging speed and low excitation intensity. However, due to the significantly higher light dose compared…
Fast ionic conduction is a defining property of solid electrolytes for all-solid-state batteries. Previous studies have suggested that liquid-like cation motion associated with fast ionic transport can disrupt crystalline symmetry, thereby…
We report a shot noise limited high speed stimulated Raman microscopy platform allowing to acquire molecular vibrational spectra over \SI{200}{\per \cm} in \SI{12}{\micro \second} at a scan rate of 40kHz. Using spectral focusing together…
Silicon Photomultipliers (SiPMs) are the state-of-the-art technology in single-photon detection with solid-state detectors. Single Photon Avalanche Diodes (SPADs), the key element of SiPMs, can now be manufactured in CMOS processes,…
Structured illumination microscopy (SIM) can achieve a $2\times$ resolution enhancement beyond the classical diffraction limit by employing illumination translations with respect to the object. This method has also been successfully…
Traditional image acquisition for cryo focused ion-beam scanning electron microscopy tomography often sees thousands of images being captured over a period of many hours, with immense data sets being produced. When imaging beam sensitive…
A direct patterning technique of gallium-irradiated superconducting silicon has been established by focused gallium-ion beam without any mask-based lithography process. The electrical transport measurements for line and square shaped…
The miniaturization of semiconductor devices to the scales where small numbers of dopants can control device properties requires the development of new techniques capable of characterizing their dynamics. Investigating single dopants…
Scanning probe microscopy is one of the most versatile windows into the nanoworld, providing imaging access to a variety of sample properties, depending on the probe employed. Tunneling probes map electronic properties of samples, magnetic…
Neutral hydrogen (HI) intensity mapping (IM) presents great promise for future cosmological large-scale structure surveys. However, a major challenge for HIIM cosmological studies is to accurately subtract the foreground contamination. An…
Stimulated Raman scattering (SRS) microscopy is a powerful label-free imaging technique that probes the vibrational response of chemicals with high specificity and sensitivity. High-power, quantum-enhanced SRS microscopes have been recently…
We describe a fully ultra-high vacuum compatible scanning tunneling microscope (STM) optimized for radio-frequency signals. It includes in-situ exchangeable tips adapted to high frequency cabling and a standard sample holder, which offer…
There is great need for high intensity proton beams from compact particle accelerators in particle physics, medical isotope production, and materials- and energy-research. To address this need, we present, for the first time, a design for a…
Comb-based optical arbitrary waveform measurement (OAWM) techniques can overcome the bandwidth limitations of conventional coherent detection schemes and may have disruptive impact on a wide range of scientific and industrial applications.…
Deciphering ion channel activity and signaling interactions within cells is one of the key tasks of neuroscience. Currently, measuring this electrophysiological activity is done using patch-clamp1-4 or voltage-sensitive imaging5-8.…
Optical frequency combs have revolutionised time and frequency metrology [1, 2]. The advent of microresonator-based frequency combs ('microcombs' [3-5]) is set to lead to the miniaturisation of devices that are ideally suited to a wide…
Four-dimensional scanning transmission electron microscopy (4D-STEM) is a powerful tool that allows for the simultaneous acquisition of spatial and diffraction information, driven by recent advancements in direct electron detector…
Line Intensity Mapping (LIM) is a new observational technique that uses low-resolution observations of line emission to efficiently trace the large-scale structure of the Universe out to high redshift. Common mm/sub-mm emission lines are…