Related papers: A model for the complex reflection coefficient of …
Inverse scattering is the process of estimating the spatial distribution of the scattering potential of an object by measuring the scattered wavefields around it. In this paper, we consider reflection tomography of high contrast objects…
Optical spectroscopy techniques such as differential reflectance and transmittance have proven to be very powerful techniques to study 2D materials. However, a thorough description of the experimental setups needed to carry out these…
Recent advances in twistor theory are applied to geometric optics in ${\Bbb{R}}^3$. The general formulae for reflection of a wavefront in a surface are derived and in three special cases explicit descriptions are provided: when the…
In this paper, we study the problem of reproducing the world lighting from a single image of an object covered with random specular microfacets on the surface. We show that such reflectors can be interpreted as a randomized mapping from the…
We present a new computation method for simulating reflection high-energy electron diffraction and the total-reflection high-energy positron diffraction experiments. The two experiments are used commonly for the structural analysis of…
The values of the signal-to-noise ratio are determined, at which the method of processing X-ray diffraction data reveals reflections with intensity less than the noise component of the background. The possibilities of the method are…
In this paper, we present a technique for estimating the geometry and reflectance of objects using only a camera, flashlight, and optionally a tripod. We propose a simple data capture technique in which the user goes around the object,…
Photoreflectance (PR) is a convenient characterization tool able to reveal optoelectronic properties of semiconductor materials and structures. It is a simple non-destructive and contactless technique which can be used in air at room…
Refractive index is a fundamental optical property of powder and a key input to the measurement of the size distribution using light scattering and the measurement of the absorption and scattering coefficients using diffuse reflectance…
Herein, the concept of point of darkness based on polarized light phase difference and absorption of light is demonstrated by simulations using low refractive index and extinction coefficient semiconductor and dielectric, and high…
In this paper we show how students can measure optical features of smartphone displays through three experiments. Observing diffraction patterns from smartphone displays allows students to determine the Pixels Per Inch (PPI). Observing…
We present a novel method of simulating wave effects in graphics using ray--based renderers with a new function: the Wave BSDF (Bidirectional Scattering Distribution Function). Reflections from neighboring surface patches represented by…
Intelligent reflecting surfaces can improve the communication between a source and a destination. The surface contains metamaterial that is configured to "reflect" the incident wave from the source towards the destination. Two incompatible…
We develop a novel and powerful method of exactly calculating various transport characteristics of waves in one-dimensional random media with (or without) coherent absorption or amplification. Using the method, we compute the probability…
In this position paper, we consider the state of computer vision research with respect to invariance to the horizontal orientation of an image -- what we term reflection invariance. We describe why we consider reflection invariance to be an…
Filled arrays of bolometers are currently being employed for use in astronomy from the far-infrared through millimeter parts of the electromagnetic spectrum. Because of the large range of wavelengths for which such detectors are applicable,…
Accurately measuring the geometry and spatially-varying reflectance of real-world objects is a complex task due to their intricate shapes formed by concave features, hollow engravings and diverse surfaces, resulting in inter-reflection and…
We have numerically computed the reflectivity of X-ray incident normally onto Fibonacci multilayers, and compared the results with those obtained in periodic approximant multilayers. The constituent layers are of low and high refractive…
We present a one-port calibration technique for characterization of beam waveguide components with a vector network analyzer. This technique involves using a set of known delays to separate the responses of the instrument and the device…
We introduce and describe a technique for distance sensing, based on second-order interferometry of thermal light. The method is based on measuring correlation between intensity fluctuations on two detectors, and provides estimates of the…