Related papers: Tip enhanced IR imaging with sub-10 nm resolution …

The ability to spatially and temporally map nanoscale environments in situ over extended timescales would be transformative for biology, biomedicine, and bioengineering. All nanometer objects, from nanoparticles down to single proteins,…

Scattering scanning near-field optical microscopy (s-SNOM) is a promising technique for overcoming Abbe diffraction limit and substantially enhancing the spatial resolution in spectroscopic imaging. The s-SNOM works by exposing an atomic…

Implicit representation mapping (IRM) can translate image features to any continuous resolution, showcasing its potent capability for ultra-high-resolution image segmentation refinement. Current IRM-based methods for refining…

In scanning gate microscopy, where the tip of a scanning force microscope is used as a movable gate to study electronic transport in nanostructures, the shape and magnitude of the tip-induced potential are important for the resolution and…

Tip-enhanced Raman spectroscopy (TERS) is a valuable method for surface analysis with nanometer to angstrom-scale resolution, however, the accurate simulation of particular TERS signals remains a computational challenge. We present a unique…

We present polynomial force reconstruction from experimental intermodulation atomic force microscopy (ImAFM) data. We study the tip-surface force during a slow surface approach and compare the results with amplitude-dependence force…

Infrared (IR) imaging is one of the significant tools for the quality control measurements of fabricated samples. Standard IR imaging techniques use direct measurements, where light sources and detectors operate at IR range. Due to the…

Sensitive mid-infrared (MIR) spectroscopy is highly demanded in various fields ranging from industrial inspection, biomedical diagnosis to astronomical observation. However, the detection sensitivity of conventional MIR spectrometers has…

SuperSpec is a novel on-chip spectrometer we are developing for multi-object, moderate resolution (R = 100 - 500), large bandwidth (~1.65:1) submillimeter and millimeter survey spectroscopy of high-redshift galaxies. The spectrometer…

Nano-FTIR imaging is a powerful scanning-based technique at nanometer spatial resolution which combines Fourier transform infrared spectroscopy (FTIR) and scattering-type scanning near-field optical microscopy (s-SNOM). However, recording…

Here we show scanning tunnelling microscopy (STM), non-contact atomic force microscopy (AFM) and inelastic electron tunnelling spectroscopy (IETS) measurements on organic molecule with a CO- terminated tip at 5K. The high-resolution…

Tip-enhanced Raman spectroscopy (TERS) is a powerful method for imaging vibrational motion and chemically characterizing surface-bound systems. Theoretical simulations of TERS images often consider systems in isolation, ignoring any…

The concepts of spoof surface plasmon polaritons and adiabatic field compression are employed to design metallic near-field probes that allow guiding and focusing of mid-infrared wavelength electromagnetic radiation and provides…

In recent years several methods to overcome diffraction limit in the far field microscopy have been demonstrated. Still the problem of superresolution is reliably solved only for fluorescent microscopy, giving a resolution of up to 20-30nm.…

The InfraRed Imaging Spectrograph (IRIS) is a first-light instrument for the Thirty Meter Telescope (TMT) that will be used to sample the corrected adaptive optics field by the Narrow-Field Infrared Adaptive Optics System (NFIRAOS) with a…

Atomic force microscopy (AFM) is widely used to measure surface topography of solid, soft, and living matter at the nanoscale. Moreover, by mapping forces as a function of distance to the surface, AFM can provide a wealth of information…

Fourier-transform infrared spectroscopy (FTIR) is a powerful analytical method for not only the chemical identification of solid, liquid, and gas species, but also the quantification of their concentration. However, the chemical…

Nanoscale fabrication and characterisation techniques critically underpin a vast range of fields, including materials science, nanoelectronics and nanobiotechnology. Focused ion beam (FIB) techniques are particularly appealing due to their…

Various methods of force measurement with the Atomic Force Microscope (AFM) are compared for their ability to accurately determine the tip-surface force from analysis of the nonlinear cantilever motion. It is explained how intermodulation,…

Total internal reflection fluorescence (TIRF) microscopy and its variants are key technologies for visualizing the dynamics of single molecules or organelles in live cells. Yet, truely quantitative TIRF remains problematic. One unknown…