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Modern scattering-type scanning near-field optical microscopy (s-SNOM) has become an indispensable tool in material research. However, as the s-SNOM technique marches into the far-infrared (IR) and terahertz (THz) regimes, emerging…
Scattering-type scanning near-field optical microscopy (s-SNOM) is instrumental in exploring polaritonic behaviors of two-dimensional (2D) materials at the nanoscale. A sharp s-SNOM tip couples momenta into 2D materials through phase…
We have studied the formation of near-field fringes when sharp edges of materials are imaged using scattering-type scanning near-field optical microscope (s-SNOM). Materials we have investigated include dielectrics, metals, near-perfect…
This manuscript demonstrates the theory, design, and simulation of scattering scanning near field microscopy (s-SNOM) in 0.5THz. A comprehensive simulation model of nanotips' geometry, sample materials, and incident field is established to…
The scattering-type Scanning Near-Field Optical Microscope (s-SNOM) is acknowledged as an excellent tool to investigate the optical properties of different materials and biological samples at the nanoscale. In this study we show that s-SNOM…
Scattering-type scanning near-field optical microscopy (s-SNOM) allows for the observation of the optical response of material surfaces with a resolution far below the diffraction limit. Based on amplitude-modulation atomic force microscopy…
Scattering-type scanning near-field microscopy (s-SNOM) at terahertz (THz) frequencies could become a highly valuable tool for studying a variety of phenomena of both fundamental and applied interest, including mobile carrier excitations or…
Optical nanoscopy is crucial in life and materials sciences, revealing subtle cellular processes and nanomaterial properties. Scattering-type Scanning Near-field Optical Microscopy (s-SNOM) provides nanoscale resolution, relying on the…
We introduce a scattering-type scanning near-field infrared microscope (s-SNIM) for the local scale near- field sample analysis and spectroscopy from room (RT) down to liquid helium (LHe) temperatures. The extension of s-SNIM down to T = 5K…
Validating material performance in electrical devices is crucial to product development. For Gallium Nitride (GaN) devices, evaluating material factors such as defects, dopant concentration, and overall production quality is essential to…
Optical microscopy has a diffraction limited resolution of about 250 nm. Fluorescence methods (e.g. PALM, STORM, STED) beat this, but they are still limited to 10 s of nm, and the images are an indirect pointillist representation of only…
Scattering-type scanning near-field optical microscopy (s-SNOM), and its derivate, Fourier transform infrared nanospectroscopy (nano-FTIR) are emerging techniques for infrared (IR) nanoimaging and spectroscopy with applications in diverse…
Scattering scanning near-field optical microscopy (s-SNOM) is a technique to enhance the spatial resolution, and when combined by Fourier transform spectroscopy it can provide spectroscopic information with high spatial resolution. This…
We theoretically study resonance responses of flat surfaces and sharp edges of the nanostructures that support excitations of phonon-polaritons in mid-infrared range. We focus on two materials: silicon carbide that has a nearly isotropic…
Scattering scanning near-field optical microscopy (s-SNOM) has emerged as a powerful nanoscale spectroscopic tool capable of characterizing individual biomacromolecules and molecular materials. However, applications of scattering-based…
Helium-ion beams (HIB) focused to sub-nanometer scales have emerged as powerful tools for high-resolution imaging as well as nano-scale lithography, ion milling or deposition. Quantifying irradiation effects is essential for reliable device…
The experimental limitations in the signal enhancement and spatial resolution in spectroscopic imaging have been always a challenging task in the application of near-field spectroscopy for nanostructured materials in the sub-diffraction…
Pseudo-heterodyne scattering-type scanning near-field optical microscopy (sSNOM) is applied in the mid-infrared region to detect the chemical composition of biomolecules on the nanoscale. However, the application of sSNOM in molecular…
Scattering scanning near-field optical microscopy (s-SNOM) is a powerful technique for mid-infrared spectroscopy at nanometer length scales. By investigating objects in aqueous environments through ultrathin membranes, s-SNOM has recently…
The ability to perform nanometer-scale optical imaging and spectroscopy is key to deciphering the low-energy effects in quantum materials, as well as vibrational fingerprints in planetary and extraterrestrial particles, catalytic…