Related papers: Design for a 10 KeV Multi-Pass Transmission Electr…
Layered materials (LMs) are at the centre of an ever increasing research effort due to their potential use in a variety of applications. The presence of imperfections, such as bi- or multilayer areas, holes, grain boundaries, isotropic and…
Microscopy with extreme ultraviolet (EUV) radiation holds promise for high-resolution imaging with excellent material contrast, due to the short wavelength and numerous element-specific absorption edges available in this spectral range. At…
The numerical analysis of the diffraction features rendered by transmission electron microscopy (TEM) typically relies either on classical approximations (Monte Carlo simulations) or quantum paraxial tomography (the multislice method and…
Multi Micro-Channel-Plate Photomultiplier tubes (MCP-PMT) with High Collection Efficiency (Hi-CE) MCPs are developed and characterised. With these Hi-CE MCPs more than 90% of photoelectrons emitted from the photocathode can be detected;…
Feature sizes in integrated circuits have decreased substantially over time, and it has become increasingly difficult to three-dimensionally image these complex circuits after fabrication. This can be important for process development,…
This paper presents the results of a study of the response of a test CMOS sensor with a radiation tolerant pixel cell design to 80 keV and 100 keV electrons. The point spread function is measured to be (13.0+/- 1.7) microns at 100 keV and…
In this paper we present a method to robustly evaluate the quantitative accuracy of various tomographic phase microscopy (TPM) methods with a multiple scattering 3D-printed microphantom with known geometry and refractive index distribution.…
Imaging energy filters in photoelectron microscopes and momentum microscopes use spherical fields with deflection angles of 90{\deg}, 180{\deg}, and even 2 x 180{\deg}. These instruments are optimized for high energy resolution, but exhibit…
Shadow X-ray Magnetic Circular Dichroism Photo-Emission Electron Microscopy (XMCD-PEEM) is a recent technique, in which the photon intensity in the shadow of an object lying on a surface, may be used to gather information about the…
Single particle cryogenic electron microscopy (cryo-EM) is an imaging technique capable of recovering the high-resolution 3-D structure of biological macromolecules from many noisy and randomly oriented projection images. One notable…
Measuring magnetic moments in ferromagnetic materials with atomic column resolution is theoretically possible using the electron magnetic circular dichroism (EMCD) technique in a (scanning) transmission electron microscope ((S)TEM).…
Label-free microscopy exploits light scattering to obtain a three-dimensional image of biological tissues. However, light propagation is affected by aberrations and multiple scattering, which drastically degrade the image quality and limit…
Imaging of magnetic domains with a photoelectron emission microscope operated with photon energies in the threshold regime often suffers from low contrast. In this work we show by symmetry considerations, photoemission calculations, and…
A new method for measuring \ngr cross sections aiming at enhanced signal-to-background ratio is presented. This new approach is based on the combination of the pulse-height weighting technique with a total energy detection system that…
A possibility of a few MeV electron beam diagnostics (Lorentz factor ~ 10) using polarization characteristics of the optical transition radiation (OTR) have been considered. Determinaton of the electron beam divergence have been performed…
Imaging spectroscopy is intended to be coupled with adaptive optics (AO) on large telescopes, such as EST, in order to produce high spatial and temporal resolution measurements of velocities and magnetic fields upon a 2D FOV. We propose a…
Aberration-corrected environmental transmission electron microscopy (ETEM) enables atomic-resolution imaging of dynamic catalytic processes. Correlating atomic-scale structural changes with reaction products detected by mass spectrometry…
Low-electron-dose observation is indispensable for observing various samples using a transmission electron microscope; consequently, image processing has been used to improve transmission electron microscopy (TEM) images. To apply such…
A method for assessing the quality of electronic material properties of thin-film metal oxide semiconductor field-effect transistors (MOSFETs) is presented. By investigating samples with MOCVD-grown MoS${_2}$ channels exposed to atmospheric…
Scanning transmission electron microscopy (STEM) has become the technique of choice for quantitative characterization of atomic structure of materials, where the minute displacements of atomic columns from high-symmetry positions can be…