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Transmission electron microscopy (TEM) is a powerful imaging tool that has found broad application in materials science, nanoscience and biology(1-3). With the introduction of aberration-corrected electron lenses, both the spatial…
Observations at mas-resolution scales and high dynamic range hold a central place in achieving, for instance, the spectroscopic characterization of exo-Earths or the detailed mapping of their protoplanetary disc birthplace. Ground or…
Scanning Transmission Electron Microscopy (STEM) offers high-resolution images that are used to quantify the nanoscale atomic structure and composition of materials and biological specimens. In many cases, however, the resolution is limited…
Absorption-free (also known as ``interaction-free'') measurement aims to detect the presence of an opaque object using a test particle without that particle being absorbed by the object. Here we consider semi-transparent objects which have…
Electrical impedance tomography with fully integrated microfluidics and electronics is presented for the first time in a CMOS chip. Chambers and electrodes are fabricated in the interconnect layers of a 65 nm CMOS chip through…
Integrated optics are used to achieve astronomical interferometry inside robust and compact materials, improving the instrument's stability and sensitivity. In order to perform differential phase measurements at the H$\alpha$ line (656.3…
We investigate the possibility of non-destructive electron diffraction imaging of a single molecule to determine its structure. The molecular specimen will be held on a free-standing sheet of graphene. Due to the high conductivity of…
Underwater images play a key role in ocean exploration, but often suffer from severe quality degradation due to light absorption and scattering in water medium. Although major breakthroughs have been made recently in the general area of…
We reveal the classical and quantum regimes of free electron interaction with radiation, common to the general variety of radiation sources (e.g. FEL, Smith-Purcell), Dielectric Laser Accelerator (DLA) and Photo-Induced Near-Field Electron…
In a focused ion beam (FIB) microscope, source particles interact with a small volume of a sample to generate secondary electrons that are detected, pixel by pixel, to produce a micrograph. Randomness of the number of incident particles…
Microelectromechanical systems (MEMS) are currently supporting ground-breaking basic research in materials science and metallurgy as they allow in situ experiments on materials at the nanoscale within electron-microscopes in a wide variety…
We describe here the implementation of an interferometer-based microwave impedance microscope on a home-built tuning-fork based scanning probe microscope (SPM). Tuning-fork based SPMs, requiring only two electrical contacts for…
Reflection phase imaging provides label-free, high-resolution characterization of biological samples, typically using interferometric-based techniques. Here, we investigate reflection phase microscopy from intensity-only measurements under…
In a 'controlled dephasing' experiment [1-3], an interferometer loses its coherence due to entanglement with a controlled quantum system ('which path' detector). In experiments that were conducted thus far in mesoscopic systems only partial…
Label-Free Multiphoton Microscopy is a very powerful optical microscopy that can be applied to study samples with no need for exogenous fluorescent probes, keeping the main benefits of a Multiphoton approach, like longer penetration depths…
The IBF and the transparent rate of electrons are two essential indicators of TPC, which affect the energy resolution and counting rate respectively. In this paper, we propose several novel strategies of staggered multi-THGEM to suppress…
We explore the potential of upcoming 21-cm interferometric observations to probe interacting dark matter (IDM). We focus on scenarios where the dark matter-baryon scattering cross-section scales as $\sigma(v) =\sigma_{0} v^n$, with…
Most integrated evanescent-field photonic sensors measure changes in either the real part or the imaginary part of the complex refractive index of the sample, i.e., refraction or absorption. Here we propose and experimentally demonstrate a…
Correlative light-electron microscopy (CLEM) unifies the versatility of light microscopy (LM) with the high resolution of electron microscopy (EM), allowing one to zoom into the complex organization of cells. Most CLEM techniques use…
Matter-wave interferometry with nanoparticles will enable the development of quantum sensors capable of probing ultraweak fields with unprecedented applications for fundamental physics. The high sensitivity of such devices however makes…