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Interferometers are widely used in imaging technologies to achieve enhanced spatial resolution, but require that the incoming photons be indistinguishable. In previous work, we built and analyzed color erasure detectors which expand the…
Using spontaneous parametric down conversion and a 50:50 beam splitter, we generate coaxial polarization-entangled photon pairs, of which the two photons are far separated from each other. The photons are then sent one by one through one…
A novel approach is proposed, where energy filtered electrons, carrying both chemical identity and electrical information, serve as fine and flexible electrodes in direct electrical measurements. The method, termed 'chemically resolved…
Low voltage transmission electron microscopy (<=80 kV) has many applications in imaging beam-sensitive samples, such as metallic nanoparticles, which may become damaged at higher voltages. To improve resolution, spherical aberration can be…
Upper limits from the current generation of interferometers targeting the 21-cm signal from high redshifts have recently begun to rule out physically realistic, though still extreme, models of the Epoch of Reionization (EoR). While…
Imperfections in integrated photonics manufacturing have a detrimental effect on the maximal achievable visibility in interferometric architectures. These limits have profound implications for further photonics technological developments…
Transmission electron microscopy (TEM) is carried out in vacuum to minimize the interaction of the imaging electrons with gas molecules while passing through the microscope column. Nevertheless, in typical devices, the pressure remains at…
Atomic Force Microscopy - Infrared (AFM-IR) has emerged as a useful technique for measuring absorption spectra with spatial resolution better than the optical diffraction limit. The technique relies on the movement of a probe for atomic…
Free electron beams such as those employed in electron microscopes have evolved into powerful tools to investigate photonic nanostructures with an unrivaled combination of spatial and spectral precision through the analysis of electron…
Lens-free on-chip digital holographic microscopy (LFOCDHM) is a modern imaging technique whereby the sample is placed directly onto or very close to the digital sensor, and illuminated by a partially coherent source located far above it.…
Cryo Focused Ion-Beam Scanning Electron Microscopy (cryo FIB-SEM) enables three-dimensional and nanoscale imaging of biological specimens via a slice and view mechanism. The FIB-SEM experiments are, however, limited by a slow (typically,…
The relative roles of multiple electron scattering and in-molecule free-space propagation in transmission electron microscopy of small molecules are discussed. It is argued that while multiple scattering tends to have only a moderate effect…
Fourier-transform infrared spectroscopy (FTIR) is an indispensable analytical method that allows label-free identification of substances via fundamental molecular vibrations. However, the sensitivity of FTIR is often limited by the low…
Event-driven sampling is a promising alternative to uniform sampling methods, particularly for systems constrained by power and hardware cost. A notable example of this sampling approach is the integrate-and-fire time encoding machine…
The extreme sensitivity of 2D materials to defects and nanostructure requires precise imaging techniques to verify presence of desirable and absence of undesirable features in the atomic geometry. Helium-ion beams have emerged as a…
The appearance of direct electron detectors marked a new era for electron diffraction. Their high sensitivity and low noise opens the possibility to extend electron diffraction from transmission electron microscopes (TEM) to lower energies…
Sub-diffraction resolution, gentle sample illumination, and the possibility to image in multiple colors make Structured Illumination Microscopy (SIM) an imaging technique which is particularly well suited for live cell observations. Here,…
A method of the mid-IR-laser microscopy has been proposed for the investigation of the large-scale electrically and recombination active defects in semiconductors and non-destructive inspection of semiconductor materials and structures in…
The application of precision interferometers is generally restricted to expensive and smooth high-quality surfaces. Here, we offer a route to ultimate miniaturization of interferometer by integrating beam splitter, reference mirror and…
The Fresnel Interferometric Imager is a space-based astronomical telescope project yielding milli-arc second angular resolution and high contrast images with loose manufacturing constraints. This optical concept involves diffractive…