Related papers: Three-dimensional force-field microscopy with opti…
We report the first experiment on the optical modulation of dispersion forces through a change of the carrier density in a Si membrane. For this purpose a high-vacuum based atomic force microscope and excitation light pulses from an Ar…
We derive a partial-wave (Mie) expansion of the axial force exerted on a transparent sphere by a laser beam focused through a high numerical aperture objective. The results hold throughout the range of interest for practical applications.…
This paper demonstrates cooling of the center-of-mass motion of 10 $\mu$m-diameter optically levitated silica spheres to an effective temperature of $50\pm22 \mu$K, achieved by minimizing the technical pointing noise of the trapping laser.…
Further improvements are made to the non-linear data analysis algorithm for the atomic force microscope [P. Attard, arXiv:1212.3019v2 (2012)]. The algorithm is required when there is curvature in the compliance region due to photo-diode…
Using optical tweezers and a haptic device, microspheres having diameters ranging from 3 to 4 um (floating in a fluid solution) are manipulated in order to form patterns of coupled optical microresonators by assembling the spheres via…
We introduce a micromachined force scale for laser power measurement by means of radiation pressure sensing. With this technique, the measured laser light is not absorbed and can be utilized while being measured. We employ silicon…
Atomic force microscopy is an important tool for characterizing surface acoustic waves, in particular for high frequencies, where the wavelength is too short to be resolved by laser interferometry. A caveat is, that the cantilever…
The implementation of a scanning microscope capable of working in confocal, atomic force and apertureless near field configurations is presented. The microscope is designed to operate in the temperature range 4 - 300 K, using conventional…
Stretchable conductors are of crucial relevance for emerging technologies such as wearable electronics, low-invasive bioelectronic implants or soft actuators for robotics. A critical issue for their development regards the understanding of…
A scanning force microscope tip is used to write ferroelectric domains in He-implanted single-crystal lithium niobate and subsequently probe them by piezoresponse force microscopy. Investigation of cross-sections of the samples showed that…
Fiber-integrated micro-optical elements promise a scalable approach to photon collection and beam shaping for quantum information processing. Here, we demonstrate single-step fabrication of micro-spherical, micro-spiral, and micro-axicon…
In this article, we present a deflection measurement setup for Atomic Force Microscopy (AFM). It is based on a quadrature phase differential interferometer: we measure the optical path difference between a laser beam reflecting above the…
The optical force density acting in transparent dielectric media due to short laser excitation is theoretically analyzed. For typical laser pulses with picosecond duration, the momentum component of the optical force becomes of the same…
Interferometry can completely redirect light, providing the potential for strong and controllable optical forces. However, small particles do not naturally act like interferometric beamsplitters, and the optical scattering from them is not…
Atomic Force Microscopy (AFM) methods utilizing resonant mechanical vibrations of cantilevers in contact with a sample surface have shown sensitivities as high as few picometers for detecting surface displacements. Such a high sensitivity…
We introduce an in-situ characterization method of resists used for e-beam lithography. The technique is based on the application of an atomic force microscope which is directly mounted below the cathode of an electron-beam lithography…
The electric forces acting on an atomic force microscope tip in solution have been measured using a microelectrochemical cell formed by two periodically biased electrodes. The forces were measured as a function of lift height and bias…
A novel scanning probe technique is presented: Scanning microSQUID Force microscopy (SSFM). The instrument features independent topographic and magnetic imaging. The SSFM operates in a dilution refrigerator in cryogenic vacuum. Sample and…
Cellular traction forces are conventionally measured by tracking the displacement of beads or micropillars, an approach fundamentally limited by optical diffraction and the classical Euler-Bernoulli beam assumption, which is accurate only…
The controllable positioning of a vacuum-levitated object near a material surface is of importance for studying short-range forces, such as Casimir forces, interfacial friction forces, or gravity in yet unexplored parameter regimes. Here we…