Related papers: Three-dimensional force-field microscopy with opti…
The electronic properties of Cu$_{0.07}$Bi$_{2}$Se$_{3}$ have been investigated using Shubnikov-de Haas and optical reflectance measurements. Quantum oscillations reveal a bulk, three-dimensional Fermi surface with anisotropy…
We demonstrate an optical conveyor belt for levitated nano-particles over several centimeters inside both air-filled and evacuated hollow-core photonic crystal fibers (HCPCF). Detection of the transmitted light field allows…
We explain and demonstrate a new method of force- and position-calibration for optical tweezers with back-focal-plane photo detection. The method combines power spectral measurements of thermal motion and the response to a sinusoidal motion…
We demonstrate a bistable optical trap by tightly focusing a vortex laser beam. The optical potential has the form of a Mexican hat with an additional minimum at the center. The bistable trapping corresponds to a non-equilibrium steady…
Using a boundary element method to calculate the electromagnetic fields and the Maxwell stress tensor method to compute the electromagnetic forces, we investigate electromagnetic wave induced forces acting on a pair of identical metal…
Traction force microscopy is a method widely used in biophysics and cell biology to determine forces that biological cells apply to their environment. In the experiment, the cells adhere to a soft elastic substrate, which is then deformed…
Knowledge of surface forces is the key to understanding a large number of processes in fields ranging from physics to material science and biology. The most common method to study surfaces is dynamic atomic force microscopy (AFM). Dynamic…
Super-resolution imaging using sub-diffraction field localization by micron sized transparent beads (microspheres) was recently demonstrated [1]. Practical applications in microscopy require control over the positioning of the microspheres.…
We demonstrate that a bichromatic standing-wave laser field can exert a significantly larger force on a molecule than ordinary radiation pressure. Our experiment measures the deflection of a pulsed supersonic beam of CaF molecules by a…
Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable…
Optical tweezers are an invaluable tool for non-contact trapping and micro-manipulation, but their ability to facilitate high-throughput volumetric microrheology of biological samples for mechanobiology research is limited by the precise…
By scanning a fine open-ended coaxial probe above an operating microwave device, we image local electric fields generated by the device at microwave frequencies. The probe is sensitive to the electric flux normal to the face of its center…
We report on progress in developing compact sensors for atomic force microscopy (AFM), in which the mechanical transducer is integrated with near-field optical readout on a single chip. The motion of a nanoscale, doubly-clamped cantilever…
A 790-nm-driven high-harmonic generation source with a repetition rate of 6 kHz is combined with a toroidal-grating monochromator and a high-detection-efficiency photoelectron time-of-flight momentum microscope to enable time- and…
We implemented the inverse design method to build a thin near-field lens that could produce a desired subwavelength focus by manipulating the near fields of a magnetic dipole source. The flat near-field lens represented by an artificial…
We report the observation in the direct space of the transport of a few thousand charges submitted to a tunable electric field along the surface of a silicon oxide layer. Charges are both deposited and observed using the same Electrostatic…
The equilibrium sizes of micro- and nano-domains caused by electric field of atomic force microscope tip in ferroelectric semiconductor crystals have been calculated. The domain was considered as a prolate semi-ellipsoid with rather thin…
Electrostatic force microscopy at cryogenic temperatures is used to probe the electrostatic interaction of a conductive atomic force microscopy tip and electronic charges trapped in localized states in an insulating layer on a…
Surface electric noise, i.e., the non-uniform distribution of charges and potentials on a surface, poses a great experimental challenge in modern precision force measurements. Such a challenge is encountered in a number of different…
We study the non-contact friction between an atomic force microscope tip and a metal substrate in the presence of bias voltage. The friction is due to energy losses in the sample created by the electromagnetic field from the oscillating…