Related papers: Three-dimensional force-field microscopy with opti…
Atomic Force Microscopy (AFM) allows to probe matter at atomic scale by measuring the perturbation of a nanomechanical oscillator induced by near-field interaction forces. The quest to improve sensitivity and resolution of AFM has forced…
We present results on the determination of the differential Casimir force between an Au-coated sapphire sphere and the top and bottom of Au-coated deep silicon trenches performed by means of the micromechanical torsional oscillator in the…
We introduce a novel three-dimensional (3D) traction force microscopy (TFM) method motivated by the recent discovery that cells adhering on plane surfaces exert both in-plane and out-of-plane traction stresses. We measure the 3D deformation…
We show that Bloch oscillations of ultracold fermionic atoms in the periodic potential of an optical lattice can be used for a sensitive measurement of forces at the micrometer length scale, e.g. in the vicinity of dielectric surface. In…
Miniaturized mechanical resonators have proven to be excellent force sensors. However, they usually rely on resonant sensing schemes, and their excellent performance cannot be utilized for the detection of static forces. Here, we report on…
The formation of various uncommon shaped voids along with regular triangular and square voids in the epitaxial 3C-SiC films on Si has been investigated by optical microscopy and atomic force microscopy. Heteroepitaxial growth of 3C-SiC…
The gradient of the Casimir force between a Si-SiO${}_2$-graphene substrate and an Au-coated sphere is measured by means of a dynamic atomic force microscope operated in the frequency shift technique. It is shown that the presence of…
Optically levitated nanoparticles in vacuum provide a highly sensitive platform for probing weak light-matter interactions. In this work, we present an interference-based method to amplify the optical force exerted by a weak field on a…
Recently, it was shown that vector beams can be utilized for fast kinematic sensing via measurements of their global polarization state [Optica 2(10), 864 (2015)]. The method relies on correlations between the spatial and polarization…
Analytical solution for optical trapping force on a spherical dielectric particle for an arbitrary positioned focused beam is presented in a generalized Lorenz-Mie and vectorial diffraction theory. In this case the exact electromagnetic…
A nanofiber-based optical tweezer is demonstrated. Trapping is achieved by combining attractive near-field optical gradient forces with repulsive electrostatic forces. Silica-coated Fe$_2$O$_3$ nanospheres of 300 diameter are trapped as…
Surface Force Apparatus (SFA) allows to accurately resolve the interfacial properties of fluids confined between extended surfaces. The accuracy of the SFA makes it an ubiquitous tool for the nanoscale mechanical characterization of soft…
Devices made from two-dimensional (2D) materials such as graphene or transition metal dichalcogenides possess interesting electronic properties that can become accessible to experimental probes when the samples are protected from…
Atomic force microscopy (AFM) is a well-known tool for studying surface roughness and to collect depth information about features on the top atomic layer of samples. By combining secondary ion mass spectroscopy (SIMS) with focused ion beam…
The reconfiguration of soft, deformable particles upon adsorption at the interface between two fluids underpins many aspects of their dynamics and interactions, ultimately controlling the macroscopic properties of particle monolayers of…
Molecular dynamics simulations have been performed to understand true atomic resolution, which has been observed on the Si(111)-7$\times$7 surface by dynamic force microscopy in ultra high vacuum(UHV). Stable atomic-scale contrast is…
We present measurement results for the gradient of the Casimir force between an Au-coated sphere and an Au-coated plate obtained by means of an atomic force microscope operated in a frequency shift technique. This experiment was performed…
Recent advances in mechanical-diode based ultrasonic force microscopy techniques are reviewed. The potential of Ultrasonic Force Microscopy (UFM) for the study of material elastic properties is explained in detail. Advantages of the…
Magnetic field imaging is a valuable resource for signal source localization and characterization. This work reports an optically pumped magnetometer (OPM) based on the free-induction-decay (FID) protocol, that implements microfabricated…
Micro-focused X-ray beams produced by third generation synchrotron sources offer new perspective of studying strains and processes at nanoscale. Atomic force microscope setup combined with a micro-focused synchrotron beam allows precise…