Micro-focused X-ray beams produced by third generation synchrotron sources offer new perspective of studying strains and processes at nanoscale. Atomic force microscope setup combined with a micro-focused synchrotron beam allows precise positioning and nanomanipulation of nanostructures under illumination. In this paper, we report on integration of a portable commercial atomic force microscope setup into a hard X-ray synchrotron beamline. Details of design, sample alignment procedure and performance of the setup are presented.
@article{arxiv.1506.00561,
title = {Versatile AFM setup combined with micro-focused X-ray beam},
author = {T. Slobodskyy and A. V. Zozulya and R. Tholapi and L. Liefeith and M. Fester and M. Sprung and W. Hansen},
journal= {arXiv preprint arXiv:1506.00561},
year = {2015}
}
Comments
To be submitted to Review of Scientific Instruments