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Deep learning is now the gold standard in computer vision-based quality inspection systems. In order to detect defects, supervised learning is often utilized, but necessitates a large amount of annotated images, which can be costly:…

Computer Vision and Pattern Recognition · Computer Science 2021-07-23 Pierre Gutierrez , Maria Luschkova , Antoine Cordier , Mustafa Shukor , Mona Schappert , Tim Dahmen

Point defects are a universal feature of crystalline materials. Their identification is often addressed by combining experimental measurements with theoretical models. The standard approach of simulating defects is, however, prone to…

Materials Science · Physics 2023-02-20 Irea Mosquera-Lois , Seán R. Kavanagh , Aron Walsh , David O. Scanlon

A central challenge in materials science is characterizing chemical processes that are elusive to direct measurement, particularly in functional materials operating under realistic conditions. Here, we demonstrate that mechanical strain…

Materials Science · Physics 2025-09-04 Royal C. Ihuaenyi , Hongbo Zhao , Ruqing Fang , Ruobing Bai , Martin Z. Bazant , Juner Zhu

Deep learning (DL) is one of the fastest growing topics in materials data science, with rapidly emerging applications spanning atomistic, image-based, spectral, and textual data modalities. DL allows analysis of unstructured data and…

Videos captured using Transmission Electron Microscopy (TEM) can encode details regarding the morphological and temporal evolution of a material by taking snapshots of the microstructure sequentially. However, manual analysis of such video…

Computer Vision and Pattern Recognition · Computer Science 2021-08-23 Mingren Shen , Guanzhao Li , Dongxia Wu , Yudai Yaguchi , Jack C. Haley , Kevin G. Field , Dane Morgan

The task of steel surface defect recognition is an industrial problem with great industry values. The data insufficiency is the major challenge in training a robust defect recognition network. Existing methods have investigated to enlarge…

Computer Vision and Pattern Recognition · Computer Science 2024-05-06 Yichun Tai , Kun Yang , Tao Peng , Zhenzhen Huang , Zhijiang Zhang

4D-STEM, in which the 2D diffraction plane is captured for each 2D scan position in the scanning transmission electron microscope (STEM) using a pixelated detector, is complementing and increasingly replacing existing imaging approaches.…

Instrumentation and Detectors · Physics 2022-07-27 Colum M. O'Leary , Benedikt Haas , Christoph T. Koch , Peter D. Nellist , Lewys Jones

Substation meters play a critical role in monitoring and ensuring the stable operation of power grids, yet their detection of cracks and other physical defects is often hampered by a severe scarcity of annotated samples. To address this…

Computer Vision and Pattern Recognition · Computer Science 2026-01-15 Jackie Alex , Justin Petter

Interface structures in complex oxides remain one of the active areas of condensed matter physics research, largely enabled by recent advances in scanning transmission electron microscopy (STEM). Yet the nature of the STEM contrast in which…

Studying the atomic structure of intrinsic defects in two-dimensional transition metal dichalcogenides is difficult since they damage quickly under the intense electron irradiation in transmission electron microscopy (TEM). However, this…

Despite decades of research, the ultimate goal of nanotechnology--top-down manipulation of individual atoms--has been directly achieved with only one technique: scanning probe microscopy. In this Review, we demonstrate that scanning…

Engineering atomic-scale defects is crucial for realizing wafer-scale, single-crystalline transition metal dichalcogenide monolayers for electronic devices. However, connecting atomic-scale defects to larger morphologies poses a significant…

Metasurfaces have shown promising potentials in shaping optical wavefronts while remaining compact compared to bulky geometric optics devices. Design of meta-atoms, the fundamental building blocks of metasurfaces, relies on trial-and-error…

In context of the universal presence of defects in additively manufactured (AM) metals, efficient computational tools are required to rapidly screen AM microstructures for mechanical integrity. To this end, a deep learning approach is used…

Materials Science · Physics 2021-05-25 Brendan P. Croom , Michael Berkson , Robert K. Mueller , Michael Presley , Steven Storck

Phase diagrams are an invaluable tool for material synthesis and provide information on the phases of the material at any given thermodynamic condition. Conventional phase diagram generation involves experimentation to provide an initial…

Advancements in fast electron detectors have enabled the statistically significant sampling of crystal structures on the nanometre scale by means of Scanning Electron Nanobeam Diffraction (SEND). Characterisation of structural similarity…

Materials Science · Physics 2022-07-28 Andy Bridger , William I. F. David , Thomas J. Wood , Mohsen Danaie , Keith T. Butler

Particulate composites underpin many solid-state chemical and electrochemical systems, where microstructural features such as multiphase boundaries and inter-particle connections strongly influence system performance. Advances in X-ray…

Materials Science · Physics 2026-05-19 Zebin Li , Shimao Deng , Yijin Liu , Jia-Mian Hu

Dislocations control the mechanical behavior of crystalline materials, yet their quantitative characterization in bulk has remained elusive. Transmission Electron Microscopy provides atomic-scale resolution but is restricted to thin foils,…

Materials Science · Physics 2026-03-05 A. Benhadjira , C. Detlefs , S. Borgi , V. Favre-Nicolin , C. Yildirim

Based on deep neural networks (DNNs), deep learning has been successfully applied to many problems, but its mechanism is still not well understood -- especially the reason why over-parametrized DNNs can generalize. A recent statistical…

Disordered Systems and Neural Networks · Physics 2025-06-10 Gang Huang , Lai Shun Chan , Hajime Yoshino , Ge Zhang , Yuliang Jin

Automated experimentation with real time data analysis in scanning transmission electron microscopy (STEM) often require end-to-end framework. The four-dimensional scanning transmission electron microscopy (4D-STEM) with high-throughput…

Computer Vision and Pattern Recognition · Computer Science 2025-08-26 Mingyu Liu , Zian Mao , Zhu Liu , Haoran Zhang , Jintao Guo , Xiaoya He , Xi Huang , Shufen Chu , Chun Cheng , Jun Ding , Yujun Xie
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