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A broad TCAD simulation analysis of a monolithic common drain bidirectional GaN HEMT was performed. We used gate-to-gate distances of 4 microns and 6 microns for the devices optimized with two field plates. The breakdown voltages were 675V…

Applied Physics · Physics 2024-10-25 Md Tahmidul Alam , Chirag Gupta

In this letter, fin-shape tri-gate $\beta$-Ga$_{2}$O$_{3}$ lateral MESFETs are demonstrated with a high power figure of merit of 0.95 GW/cm$^{2}$ - a record high for any $\beta$-Ga$_{2}$O$_{3}$ transistor to date. A low-temperature undoped…

Applied Physics · Physics 2022-10-12 Arkka Bhattacharyya , Saurav Roy , Praneeth Ranga , Carl Peterson , Sriram Krishnamoorthy

In this paper, we investigated a gate driver using a GaN HEMT push-pull configuration for the high-frequency hard switching of a SiC power MOSFET. Low on-resistance and low input capacitance of GaN HEMTs are suitable for a high-frequency…

Signal Processing · Electrical Eng. & Systems 2017-11-09 Takafumi Okuda , Takashi Hikihara

We show that a cryogenic amplifier composed of a homemade GaAs high-electron-mobility transistor (HEMT) is suitable for current-noise measurements in a mesoscopic device at dilution-refrigerator temperatures. The lower noise characteristics…

Mesoscale and Nanoscale Physics · Physics 2021-02-25 Sanghyun Lee , Masayuki Hashisaka , Takafumi Akiho , Kensuke Kobayashi , Koji Muraki

Hexagonal boron nitride (h-BN) encapsulation significantly improves carrier transport in graphene. This work investigates the benefit of implementing the encapsulation technique in graphene field-effect transistors (GFET) in terms of their…

Mesoscale and Nanoscale Physics · Physics 2019-03-28 Pedro C. Feijoo , Francisco Pasadas , José M. Iglesias , El Mokhtar Hamham , Raúl Rengel , David Jiménez

This letter reports high-performance $\mathrm{\beta} Ga2O3 thin channel MOSFETs with T-gate and degenerately doped source/drain contacts regrown by MOCVD. Gate length scaling (LG= 160-200 nm) leads to a peak drain current (ID,MAX) of 285…

Recently discovered double gamma/beta ({\gamma}/\b{eta}) polymorph Ga2O3 structures constitute a class of novel materials providing an option to modulate functional properties across interfaces without changing chemical compositions of…

We present a method to obtain quantitative profiles of surface state charge density and monitor its dynamics under various stress conditions in high electron mobility transistor (HEMT) devices. The method employs an optical spectroscopy of…

Applied Physics · Physics 2019-08-05 Yury Turkulets , Ilan Shalish

In this article, we investigate through numerical simulation the reduction of self-heating effects (SHEs) in GaN HEMT via the integration of hexagonal boron nitride (h-BN) as a passivation layer and as a release layer to transfer GaN HEMT…

Computational Physics · Physics 2024-01-29 Fatima Z. Tijent , Mustapha Faqir , Paul L. Voss , Jean-Paul Salvestrini , Abdallah Ougazzaden

We will describe the thermal performance of power semiconductor module, which consists of hetero-junction bipolar transistors (HBTs), for mobile communication systems. We calculate the thermal resistance between the HBT fingers and the…

Materials Science · Physics 2007-09-13 Y. Osone

A technically simple and physically clear method is suggested for the direct measurement of brightness temperature of two-dimensional electron gas (2DEG) in the channel of a high electron mobility transistor (HEMT). The usage of the method…

Mesoscale and Nanoscale Physics · Physics 2016-05-04 A. M. Korolev , V. M. Shulga , O. G. Turutanov , V. I. Shnyrkov

This work presents a novel Gallium nitride (GaN) high-electron-mobility transistor (HEMT) based ultraviolet photodetector architecture integrating advanced material and structural design strategies to enhance detection performance and…

Optics · Physics 2025-08-12 Mustafa Kilin , Firat Yasar

In this work, we demonstrate a passivation-free Ga-polar recessed-gate AlGaN/GaN HEMT on a sapphire substrate for W-band operation, featuring a 5.5 nm Al0.35Ga0.65N barrier under the gate and a 31 nm Al0.35Ga0.65N barrier in the gate access…

We report the operation of LaAlO_3 / SrTiO_3 depletion mode top-gated junction field-effect transistors using a range of LaAlO_3 thicknesses as the top gate insulator. Gated Hall bars show near ideal transistor characteristics at room…

Materials Science · Physics 2015-06-16 M. Hosoda , Y. Hikita , H. Y. Hwang , C. Bell

Using recently available GaN FETs, a 600 Volt three-stage, multi-FET switch has been developed having 2 nanosecond rise time driving a 200 Ohm load with the potential of approaching 30 MHz average switching rates. Possible applications…

Accelerator Physics · Physics 2017-05-02 D. Frolov , H. Pfeffer , G. Saewert

We report on low-frequency measurements of few electrons floating on superfluid helium using a bespoke cryogenic cascode amplifier circuit built with off-the-shelf GaAs High-Electron-Mobility Transistors (HEMTs). We integrate this circuit…

Mesoscale and Nanoscale Physics · Physics 2024-12-04 Mayer M. Feldman , Gordian Fuchs , Tiffany Liu , Luke A. D'Imperio , M. David Henry , Eric A. Shaner , Stephen A. Lyon

Various simulations of a GaN HEMT are used to study the behaviors of two different energy-transport models: the Fermi kinetics transport model and a hydrodynamics transport model as it is implemented in the device simulator Sentaurus from…

Mesoscale and Nanoscale Physics · Physics 2022-12-21 Ashwin Tunga , Kexin Li , Nicholas C. Miller , Matt Grupen , John D. Albrecht , Shaloo Rakheja

Field-effect transistors based on band-to-band tunneling (BTBT) have gained a lot of recent interest due to their potential for reducing power dissipation in integrated circuits. In this paper we present a detailed performance comparison…

Mesoscale and Nanoscale Physics · Physics 2009-11-13 Siyuranga O. Koswatta , Mark S. Lundstrom , Dmitri E. Nikonov

The band-to-band tunneling transistors have some performance advantages over the conventional MOSFETs due to the <60mV/dec sub-threshold slope. In this paper, carbon nanotubes are used as a model channel material to address issues that we…

Mesoscale and Nanoscale Physics · Physics 2010-01-29 Yunfei Gao , Siyuranga O. Koswatta , Dmitri E. Nikonov , Mark S. Lundstrom

Short-term reliability and robustness of 110 nm AlN/GaN HEMTs has been evaluated by means of off-state, semi-on state and on-state step stress tests on devices having different gate-drain distance, LGD. While breakdown voltages and critical…