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The implementation of a scanning microscope capable of working in confocal, atomic force and apertureless near field configurations is presented. The microscope is designed to operate in the temperature range 4 - 300 K, using conventional…

Other Condensed Matter · Physics 2009-11-10 P. S. Fodor , H. Zhu , N. G. Patil , J. Levy

Microscopy is an essential tool in scientific research, enabling the visualization of structures at micro- and nanoscale resolutions. However, the field of microscopy often encounters limitations in field-of-view (FOV), restricting the…

Image and Video Processing · Electrical Eng. & Systems 2025-03-17 Huanhuan Zhao , Ruben Millan-Solsona , Marti Checa , Spenser R. Brown , Jennifer L. Morrell-Falvey , Liam Collins , Arpan Biswas

We demonstrate the measurement of laterally induced optical forces using an Atomic Force Microscope (AFM). The lateral electric field distribution between a gold coated AFM probe and a nano-aperture in a gold film is mapped by measuring the…

We propose an atomic norm minimization (ANM) estimator of frequencies in a noisy complex sinusoidal signal that integrates Georgiou's filter bank (G-filter) with multiple output vectors (MOV). Unlike our previous work on the G-filter…

Optimization and Control · Mathematics 2026-01-27 Jiale Tang , Bin Zhu

Pseudo-heterodyne scattering-type scanning near-field optical microscopy (sSNOM) is applied in the mid-infrared region to detect the chemical composition of biomolecules on the nanoscale. However, the application of sSNOM in molecular…

Instrumentation and Detectors · Physics 2025-08-06 Yusuke Sakiyama , Emanuel Pfitzner , Santiago H. Andany , Georg E. Fantner , Joachim Heberle

Quantum parameter estimation is central to many fields such as quantum computation, communications and metrology. Optimal estimation theory has been instrumental in achieving the best accuracy in quantum parameter estimation, which is…

Quantum Physics · Physics 2015-06-18 Shibdas Roy , Ian R. Petersen , Elanor H. Huntington

Sub-nm resolution images can be achieved by Atomic Force Microscopy (AFM) on samples that are deposited on hard substrates. However, it is still extremely challenging to image soft interfaces, such as biological membranes, due to the…

Atomic-resolution imaging with scanning transmission electron microscopy is a powerful tool for characterizing the nanoscale structure of materials, in particular features such as defects, local strains, and symmetry-breaking distortions.…

We propose a statistical framework for the problem of parameter estimation from a noisy optomechanical system. The Cram\'er-Rao lower bound on the estimation errors in the long-time limit is derived and compared with the errors of…

Optics · Physics 2013-10-31 Shan Zheng Ang , Glen I. Harris , Warwick P. Bowen , Mankei Tsang

We describe one of the largest radio-frequency RF atomic magnetometers presently operating. A total atomic volume of 128 $\mathrm{cm^3}$, with correspondingly large number of $^{87}$Rb atoms, can reduce atom noise. A total of 44 passes of…

We demonstrate that the method of characterizing viscoelastic materials with Atomic Force Microscopy (AFM) by fitting analytical models to force-distance (FD) curves often yields conflicting and physically unrealistic results. Because this…

The aim of this article is to provide a complete analysis of the behavior of a noncontact atomic force microscope (NC-AFM). We start with a review of the equations of motion of a tip interacting with a surface in which the stability…

Atomic and Molecular Clusters · Physics 2016-08-16 Gérard Couturier , Rodolphe Boisgard , Laurent Nony , Jean-Pierre Aimé

At first sight piezoresponse force microscopy (PFM) seems an ideal technique for the determination of piezoelectric coefficients (PCs), thus making use of its ultra-high vertical resolution (<0.1 pm/V). Christman et al. \cite{Chr98} first…

Materials Science · Physics 2009-11-13 T. Jungk , A. Hoffmann. , E. Soergel

Imaging of structural defects in a material can be realized with a radio-frequency atomic magnetometer by monitoring the material's response to a radio-frequency excitation field. We demonstrate two measurement configurations that enable…

Applied Physics · Physics 2019-03-27 P. Bevington , R. Gartman , W. Chalupczak

We suggest simple model of image formation in atomic force microscope (AFM) taking into account contact deformations of probe and sample during scanning. The model explains the possibility of AFM visualization of regular atomic or molecular…

Materials Science · Physics 2011-07-25 M. O. Gallyamov , I. V. Yaminsky

Efforts to map atomic-scale chemistry at low doses with minimal noise using electron microscopes are fundamentally limited by inelastic interactions. Here, fused multi-modal electron microscopy offers high signal-to-noise ratio (SNR)…

The problem of estimating the frequency of a two-level atom in a noisy environment is studied. Our interest is to minimise both the energetic cost of the protocol and the statistical uncertainty of the estimate. In particular, we prepare a…

The estimation of the frequencies of multiple superimposed exponentials in noise is an important research problem due to its various applications from engineering to chemistry. In this paper, we propose an efficient and accurate algorithm…

Numerical Analysis · Mathematics 2016-05-05 Shanglin Ye , Elias Aboutanios

Atomic force microscopes have proved to be fundamental research tools in many situations where a gentle imaging process is required, and in a variety of environmental conditions, such as the study of biological samples. Among the possible…

Systems and Control · Computer Science 2023-01-05 Marco Coraggio , Martin Homer , Oliver D. Payton , Mario di Bernardo

Accelerator mass spectrometry (AMS) is a widely-used technique with multiple applications, including geology, molecular biology and archeology. In order to achieve a high dynamic range, AMS requires tandem accelerators and large magnets,…

Quantum Physics · Physics 2023-05-23 Radu Ionicioiu
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