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We report on progress in developing compact sensors for atomic force microscopy (AFM), in which the mechanical transducer is integrated with near-field optical readout on a single chip. The motion of a nanoscale, doubly-clamped cantilever…
Atomic Force Microscopy (AFM) operating in the frequency modulation mode with a metal tip functionalized with a CO molecule images the internal structure of molecules with an unprecedented resolution. The interpretation of these images is…
Atomic force microscope (AFM) generally works on the basis of manipulating absolute magnitude of van der Waals (vdW) force between the tip and specimen. The force is, however, less sensitive to alternation of atom species than to tip-sample…
The use of differential phase contrast (DPC) in scanning transmission electron microscopy (STEM) has shown much promise for directly investigating the functional properties of a material system, leveraging the natural coupling between the…
Optical tracking was used to characterize acoustic radiation force (ARF) induced displacements in a tissue-mimicking phantom. Amplitude modulated (AM) 3.3 MHz ultrasound was used to induce ARF in the phantom which was embedded with 10…
Knowledge of surface forces is the key to understanding a large number of processes in fields ranging from physics to material science and biology. The most common method to study surfaces is dynamic atomic force microscopy (AFM). Dynamic…
The Photonic Force Microscope (PFM) is an opto-mechanical technique based on an optical trap that can be assumed to probe forces in microscopic systems. This technique has been used to measure forces in the range of pico- and femto-Newton,…
We present the design and implementation of a scanning probe microscope, which combines electrically detected magnetic resonance (EDMR) and (photo-)conductive atomic force microscopy ((p)cAFM). The integration of a 3-loop 2-gap X-band…
Dynamic-mode atomic force microscopy (AFM) in liquid remains complicated due to the strong viscous damping of the cantilever resonance. Here we show that a high-quality resonance (Q>20) can be achieved in aqueous solution by attaching a…
We present the design and experimental results of a near-field scanning microwave microscope (NSMM) working at a frequency of 1GHz. Our microscope is unique in that the sensing probe is separated from the excitation electrode to…
Quantum parameter estimation plays a key role in many fields like quantum computation, communication and metrology. Optimal estimation allows one to achieve the most precise parameter estimates, but requires accurate knowledge of the model.…
Atomic force microscope (AFM) users often calibrate the spring constants of cantilevers using functionality built into individual instruments. This is performed without reference to a global standard, which hinders robust comparison of…
The force between two interacting particles as a function of distance is one of the most fundamental curves in science. In this regard, Atomic Force Microscopy (AFM) represents the most powerful tool in nanoscience but with severe limits…
Resonant frequency modulation spectroscopy has been previously used as a highly-sensitive method for measuring the output of cold atom interferometers. Using a detailed model that accounts for optical saturation, laser intensities and…
An ongoing challenge in atomic force microscope (AFM) experiments is the quantitative measurement of cantilever motion. The vast majority of AFMs use the optical beam deflection (OBD) method to infer the deflection of the cantilever. The…
A new technique for the fabrication of highly sensitive qPlus sensor for atomic force microscopy (AFM) is described. Focused ion beam was used to cut then weld onto a bare quartz tuning fork a sharp micro-tip from an electrochemically…
Multiparameter estimation is a general problem that aims at measuring unknown physical quantities, obtaining high precision in the process. In this context, the adoption of quantum resources promises a substantial boost in the achievable…
Intermodulation atomic force microscopy (IMAFM) is a dynamic mode of atomic force microscopy (AFM) with two-tone excitation. The oscillating AFM cantilever in close proximity to a surface experiences the nonlinear tip-sample force which…
Phase estimation is the most investigated protocol in quantum metrology, but its performance is affected by the presence of noise, also in the form of imperfect state preparation. Here we discuss how to address this scenario by using a…
Atomistic foundation models (AFMs) have great promise as accurate interatomic potentials, and have enabled data-efficient molecular dynamics simulations with near quantum mechanical accuracy. However, AFMs remain markedly slower at…