Efforts to map atomic-scale chemistry at low doses with minimal noise using electron microscopes are fundamentally limited by inelastic interactions. Here, fused multi-modal electron microscopy offers high signal-to-noise ratio (SNR) recovery of material chemistry at nano- and atomic- resolution by coupling correlated information encoded within both elastic scattering (high-angle annular dark field (HAADF)) and inelastic spectroscopic signals (electron energy loss (EELS) or energy-dispersive x-ray (EDX)). By linking these simultaneously acquired signals, or modalities, the chemical distribution within nanomaterials can be imaged at significantly lower doses with existing detector hardware. In many cases, the dose requirements can be reduced by over one order of magnitude. This high SNR recovery of chemistry is tested against simulated and experimental atomic resolution data of heterogeneous nanomaterials.
@article{arxiv.2203.02024,
title = {Imaging Atomic-Scale Chemistry from Fused Multi-Modal Electron Microscopy},
author = {Jonathan Schwartz and Zichao Wendy Di and Yi Jiang and Alyssa J. Fielitz and Don-Hyung Ha and Sanjaya D. Perera and Ismail El Baggari and Richard D. Robinson and Jeffrey A. Fessler and Colin Ophus and Steve Rozeveld and Robert Hovden},
journal= {arXiv preprint arXiv:2203.02024},
year = {2023}
}