Related papers: Effect of lateral tip motion on multifrequency ato…
Piezoresponse Force Microscopy is a powerful but delicate nanoscale technique that measures the mechanical response resulting from the application of a highly localized electric field. Though mechanical response is normally due to…
We have studied theoretically magnetic resonance force microscopy (MRFM) with a high frequency nanomechanical cantilever when the cantilever frequency matches the resonant frequency of a single electron spin. Our estimations show that in…
Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable…
Kelvin Probe Force Microscopy (KPFM) is widely used to measure the surface potential on samples, from which electrostatic patch force can be calculated. However, since the KPFM measurements represent a weighted average of local potentials…
We present a detailed experimental study on the electrostatic interaction between a quantum dot and the metallic tip of a scanning force microscope. Our method allowed us to quantitatively map the tip-induced potential and to determine the…
It has been shown that electron transitions, as measured in a scanning tunnelling microscope (STM), are related to chemical interactions in a tunnelling barrier. Here, we show that the shape and apparent height of subatomic features in an…
We investigate nano scanning in tapping mode atomic force microscopy (AFM) under quality (Q) control via numerical simulations performed in SIMULINK. We focus on the simulation of whole scan process rather than the simulation of cantilever…
Magnetic force microscopy (MFM) is a well-established technique in scanning probe microscopy that allows for the imaging of magnetic samples with a spatial resolution of tens of nm and stray fields down to the mT range. The spatial…
Single-spin detection is one of the important challenges facing the development of several new technologies, e.g. single-spin transistors and solid-state quantum computation. Magnetic resonance force microscopy with a cyclic adiabatic…
In atomic force microscopy (AFM) tip-surface interactions are usually considered as functions of the tip position only, so-called force curves. However, tip-surface interactions often depend on the tip velocity and the past tip trajectory.…
Atomic Force Microscopy (AFM) allows to reconstruct the topography of surface with a resolution in the nanometer range. The exceptional resolution attainable with the AFM makes this instrument a key tool in nanoscience and technology. The…
Atomic force microscopy using a magnetic tip is a promising tool for investigating conductivity on the nano-scale. By the oscillating magnetic tip eddy currents are induced in the conducting parts of the sample which can be detected in the…
We present the design and implementation of a scanning probe microscope, which combines electrically detected magnetic resonance (EDMR) and (photo-)conductive atomic force microscopy ((p)cAFM). The integration of a 3-loop 2-gap X-band…
Correlative nanoscale surface characterization benefits from simultaneously measuring electronic and structural properties in the same environment, a capability that is essential for modern-day materials science and semiconductor failure…
Atomic Force Microscopy (AFM) allows to probe matter at atomic scale by measuring the perturbation of a nanomechanical oscillator induced by near-field interaction forces. The quest to improve sensitivity and resolution of AFM has forced…
The effect of an external bias voltage and fluctuating electromagnetic fields on both the fundamental frequency and damping of cantilever vibrations is considered. An external voltage induces surface charges causing cantilever-sample…
The use of atomic force microscopy on nanomechanical measurements requires accurate calibration of the cantilever's spring constant ($k_c$) and the optical lever sensitivity ($OLS$). The thermal method, based on the cantilever's thermal…
We analyze a single-spin measurement using a transient process in magnetic force microscopy (MFM) which could increase the maximum operating temperature by a factor of Q (the quality factor of the cantilever) in comparison with the static…
Background forces are linear long-range interactions of the cantilever body with its surroundings that must be compensated for in order to reveal tip-surface force, the quantity of interest for determining material properties in atomic…
We study the effects of wave function collapses in the oscillating cantilever driven adiabatic reversals (OSCAR) magnetic resonance force microscopy (MRFM) technique. The quantum dynamics of the cantilever tip (CT) and the spin is analyzed…