Background force compensation in dynamic atomic force microscopy
Abstract
Background forces are linear long-range interactions of the cantilever body with its surroundings that must be compensated for in order to reveal tip-surface force, the quantity of interest for determining material properties in atomic force microscopy. We provide a mathematical derivation of a method to compensate for background forces, apply it to experimental data, and discuss how to include background forces in simulation. Our method, based on linear-response theory in the frequency domain, provides a general way of measuring and compensating for any background force and it can be readily applied to different force reconstruction methods in dynamic AFM.
Keywords
Cite
@article{arxiv.1701.04638,
title = {Background force compensation in dynamic atomic force microscopy},
author = {Riccardo Borgani and Per-Anders Thorén and Daniel Forchheimer and Illia Dobryden and Si Mohamed Sah and Per Martin Claesson and David B. Haviland},
journal= {arXiv preprint arXiv:1701.04638},
year = {2017}
}
Comments
Author prepared version of a manuscript published at Physical Review Applied. Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI