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Intermodulation atomic force microscopy (IMAFM) is a dynamic mode of atomic force microscopy (AFM) with two-tone excitation. The oscillating AFM cantilever in close proximity to a surface experiences the nonlinear tip-sample force which…
The ongoing development of single electron, nano and atomic scale semiconductor devices would benefit greatly from a characterization tool capable of detecting single electron charging events with high spatial resolution, at low…
In this letter, we propose a modulation classification algorithm which is based on the received signal's amplitude for coherent optical receivers. The proposed algorithm classifies the modulation format from several possible candidates by…
We present a detailed analysis of an application of frequency modulation (FM) spectroscopy in the high modulation depth limit. We have recently completed and reported a measurement of the Stark shift in the indium $5p_{1/2}\rightarrow…
The presence of electrostatic forces and associated artifacts complicates the interpretation of piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM). Eliminating these artifacts provides an opportunity for…
Using electrostatic coupling between an AFM tip and a metallic surface as a test interaction, we here present the measurement of the force between the tip and the surface, together with the measurement of the interaction stiffness and the…
Atomic force microscopy (AFM) using qPlus sensors is a powerful tool for high-resolution analysis in various liquids, including high-viscosity or opaque environments. However, the relatively high displacement sensor noise density (n_{ds}),…
Solution-processed two-dimensional (2D) materials hold promise for their scalable applications. However, the random, fragmented nature of the solution-processed nanoflakes and the poor percolative conduction through their discrete networks…
Photo-induced forces can be used to manipulate and cool the mechanical motion of oscillators. When the oscillator is used as a force sensor, such as in atomic force microscopy, active feedback is an enticing route to enhancing measurement…
Electric Scanning Probe Microscopies are used to characterize the surface behavior of ferroelectric materials. The effects of local charge density on the chemistry and physics of ferroelectric surfaces are investigated. The kinetics and…
High-frequency atomic force microscopy has enabled extraordinary new science through large bandwidth, high speed measurements of atomic and molecular structures. However, traditional optical detection schemes restrict the dimensions, and…
Magnetic force microscopy (MFM) is long established as a powerful tool for probing the local manifestation of magnetic nanostructures across a range of temperatures and applied stimuli. A major drawback of the technique, however, is that…
Rapid evolutions of microscopic fields govern the majority of elementary excitations in condensed matter and drive microelectronic currents at increasing frequencies. Beyond nominal "radio frequencies", however, access to local electric…
We report mechanical detection of ferromagnetic resonance signals from microscopic Co single layer thin films using a magnetic resonance force microscope (MRFM). Variations in the magnetic anisotropy field and the inhomogeneity of were…
We study the detection of weak coherent forces by means of an optomechanical device formed by a highly reflecting isolated mirror shined by an intense and highly monochromatic laser field. Radiation pressure excites a vibrational mode of…
We experimentally investigated the contrast mechanism of infrared photoinduced force microscopy (PiFM) for recording vibrational resonances. Extensive experiments have demonstrated that spectroscopic contrast in PiFM is mediated by…
We developed a time-resolved force microscopy technique by integrating atomic force microscopy using a tuning-fork-type cantilever with the delay time modulation method for optical pump-probe light. We successfully measured the dynamics of…
A simulation of an atomic force microscope operating in the constant amplitude dynamic mode is described. The implementation mimics the electronics of a real setup including a digital phase-locked loop (PLL). The PLL is not only used as a…
We have developed a low temperature, high resolution magnetic force microscope (MFM) using a quartz tuning fork that can operate in a magnetic field. A tuning fork with a spring constant of 1300 N/m mounted with a commercial MFM cantilever…
Single-spin detection is one of the important challenges facing the development of several new technologies, e.g. single-spin transistors and solid-state quantum computation. Magnetic resonance force microscopy with a cyclic adiabatic…