Time-resolved force microscopy using delay-time modulation method
Applied Physics
2024-01-15 v1 Instrumentation and Detectors
Optics
Abstract
We developed a time-resolved force microscopy technique by integrating atomic force microscopy using a tuning-fork-type cantilever with the delay time modulation method for optical pump-probe light. We successfully measured the dynamics of surface recombination and diffusion of photoexcited carriers in bulk WSe2, which is challenging owing to the effect of tunneling current in time-resolved scanning tunneling microscopy. The obtained results were comprehensively explained with the model based on the dipole-dipole interaction induced by photo illumination.
Keywords
Cite
@article{arxiv.2401.06359,
title = {Time-resolved force microscopy using delay-time modulation method},
author = {Hiroyuki Mogi and Rin Wakabayashi and Shoji Yoshida and Yusuke Arashida and Atsushi Taninaka and Katsuya Iwaya and Takeshi Miura and Osamu Takeuchi and Hidemi Shigekawa},
journal= {arXiv preprint arXiv:2401.06359},
year = {2024}
}
Comments
13 pages, 4 figures