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A method to measure the viscosity of liquids at microscales is presented. It uses a thin glass fiber fixed on the tip of the cantilever of an extremely low noise Atomic Force Microscope (AFM), which accurately measures the cantilever…

Soft Condensed Matter · Physics 2013-11-12 Clemence Devailly , Justine Laurent , Audrey Steinberger , Ludovic Bellon , Sergio Ciliberto

A new method is introduced for calibrating lateral force as measured by an atomic force microscope (AFM), making use of both an interferometric detector and an optical beam detector on the same instrument. The method may be implemented…

Mesoscale and Nanoscale Physics · Physics 2025-03-25 Joel Lefever , Aleksander Labuda , Roger Proksch

The Transient Fluctuation Theorem is used to calibrate an Atomic Force Microscope by measuring the fluctuations of the work performed by a time dependent force applied between a collo{\"i}dal probe and the surface. From this measure one can…

Mesoscale and Nanoscale Physics · Physics 2020-12-02 Samuel Albert , Aubin Archambault , Artyom Petrosyan , Caroline Crauste-Thibierge , Ludovic Bellon , Sergio Ciliberto

Atomic force microscopy (AFM) is a powerful tool to investigate interaction forces at the micro and nanoscale. Cantilever stiffness, dimensions and geometry of the tip can be chosen according to the requirements of the specific application,…

Applied Physics · Physics 2020-07-31 M. Chighizola , L. Puricelli , L. Bellon , A. Podestà

We demonstrate the measurement of laterally induced optical forces using an Atomic Force Microscope (AFM). The lateral electric field distribution between a gold coated AFM probe and a nano-aperture in a gold film is mapped by measuring the…

Deformation of a fluid interface caused by the presence of objects at the interface can lead to large lateral forces between the objects. We explore these fluid-mediated attractive force between partially submerged vertical cylinders.…

Soft Condensed Matter · Physics 2014-12-04 Jennifer M. Rieser , P. E. Arratia , A. G. Yodh , J. P. Gollub , D. J. Durian

The electric forces acting on an atomic force microscope tip in solution have been measured using a microelectrochemical cell formed by two periodically biased electrodes. The forces were measured as a function of lift height and bias…

Materials Science · Physics 2008-03-13 B. J. Rodriguez , S. Jesse , K. Seal , A. P. Baddorf , S. V. Kalinin

This article describes how a frequency modulation AFM using a hanging fiber force probe made from a quartz tuning fork provides local measurements on liquid-liquid interfaces. After detailing the manufacture and calibration of the force…

Mesoscale and Nanoscale Physics · Physics 2022-05-23 Matthieu Rocheron , Christian Curtil , Hubert R. Klein

Atomic force microscopy is an important tool for characterizing surface acoustic waves, in particular for high frequencies, where the wavelength is too short to be resolved by laser interferometry. A caveat is, that the cantilever…

Mesoscale and Nanoscale Physics · Physics 2022-09-29 Jan Hellemann , Filipp Müller , Madeleine Msall , Paulo V. Santos , Stefan Ludwig

The mechanical properties of collagen fibrils depend on the amount and the distribution of water molecules within the fibrils. Here, we use atomic force microscopy (AFM) to study the effect of hydration on the viscoelastic properties of…

Soft Condensed Matter · Physics 2019-10-03 Manuel R. Uhlig , Robert Magerle

Measurements with an atomic force microscope (AFM) offer a direct way to probe elastic properties of lipid bilayer membranes locally: provided the underlying stress-strain relation is known, material parameters such as surface tension or…

Soft Condensed Matter · Physics 2007-05-23 Davood Norouzi , Martin Michael Mueller , Markus Deserno

Experimental methods and procedures required for precision measurements of the Casimir force are presented. In particular, the best practices for obtaining stable cantilevers, calibration of the cantilever, correction of thermal and…

Quantum Physics · Physics 2009-11-13 Hsiang-Chih Chiu , Chia-Cheng Chang , R. Castillo-Garza , F. Chen , U. Mohideen

A spreadsheet algorithm is given for the atomic force microscope that accounts for non-linear behavior in the deflection of the cantilever and in the photo-diode response. In addition, the data analysis algorithm takes into account…

Soft Condensed Matter · Physics 2013-01-15 Phil Attard

In atomic force microscopy (AFM), the angle relative to the vertical ($\theta_{i}$) that the tip apex of a cantilever moves is determined by the tilt of the probe holder and the geometries of the cantilever and actuated eigenmode $i$. Even…

Mesoscale and Nanoscale Physics · Physics 2017-08-01 Joseph L. Garrett , Lisa J. Krayer , Kevin J. Palm , Jeremy N. Munday

Using atomic force microscopy on silica and float glass surfaces, we give evidence that the roughness of melted glass surfaces can be quantitatively accounted for by frozen capillary waves. In this framework the height spatial correlations…

Other Condensed Matter · Physics 2007-05-23 Thomas Sarlat , Anne Lelarge , Elin Sondergard , Damien Vandembroucq

Atomic Force Microscopy (AFM) methods utilizing resonant mechanical vibrations of cantilevers in contact with a sample surface have shown sensitivities as high as few picometers for detecting surface displacements. Such a high sensitivity…

Mesoscale and Nanoscale Physics · Physics 2017-02-01 Nina Balke , Stephen Jesse , Ben Carmichael , M. Baris Okatan , Ivan I. Kravchenko , Sergei V. Kalinin , Alexander Tselev

Metrological AFM measurements are performed on the silica glass interfaces of photonic band-gap fibres and hollow capillaries. The freezing of attenuated out-of-equilibrium capillary waves during the drawing process is shown to result in a…

The evaluation of fluid forces on the stem is important for wear prediction of valve and actuator guidance parts. While estimating the axial load is straight forward, estimating and/or measuring the side load is more difficult, especially…

Classical Physics · Physics 2009-09-07 Jerome Ferrari

The capillary force was measured by atomic force microscopy between a gold coated sphere mounted on a cantilever and gold surfaces with different roughness. For smooth surfaces the capillary adhesive force surpasses in magnitude any…

Materials Science · Physics 2009-11-13 P. J. van Zwol , G. Palasantzas , J. Th. M. De Hosson

Torsional harmonic cantilevers allow measurement of time varying tip-sample forces in tapping-mode atomic force microscopy. Accuracy of these force measurements is important for quantitative nanomechanical measurements. Here we demonstrate…

Instrumentation and Detectors · Physics 2008-11-26 Ozgur Sahin
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