Related papers: Capillary force on a tilted cylinder: AFM measurem…
Micron-sized objects confined in thin liquid films interact through forces mediated by the deformed liquid-air interface. This capillary interactions provide a powerful driving mechanism for the self-assembly of ordered structures such as…
Capillary forces have been measured by Atomic Force Microscopy in the plate-sphere setup between gold, borosilicate glass, GeSbTe, titanium, and UV irradiated amorphous titaniumdioxide surfaces. The force measurements were performed as a…
Intermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force microscopy that probes the nonlinear tip-surface force by measurement of the mixing of multiple tones in a frequency comb. A high $Q$ cantilever resonance and…
In this article, we present a deflection measurement setup for Atomic Force Microscopy (AFM). It is based on a quadrature phase differential interferometer: we measure the optical path difference between a laser beam reflecting above the…
We report on the measurement of the Casimir force between conducting surfaces in a parallel configuration. The force is exerted between a silicon cantilever coated with chromium and a similar rigid surface and is detected looking at the…
We report the details of construction and testing of a Quantum Twisting Microscope, a recently developed scanning probe instrument that enables twist angle dependent electronic measurements on layered materials. Our implementation is based…
We review here the physics of capillary condensation of liquids in confined media, with a special regard to the application in nanotechnologies. The thermodynamics of capillary condensation and thin film adsorption are first exposed along…
We study the interaction between capillary forces and deformation in the context of a deformable capillary adhesive: a clamped, tense membrane is adhered to a rigid substrate by the surface tension of a liquid droplet. We find that the…
In the context of the Large Binocular Telescope project, we present the results of force actuator calibrations performed on an adaptive secondary prototype called P45, a thin deformable glass with magnets glued onto its back.…
An electro-mechanical setup for the measurement of AC-forces in a low-temperature tunnelling microscope has been developed, which enables extremely high force resolution. The crosstalk of vibrations onto the tunnelling current is used to…
We report on progress in developing compact sensors for atomic force microscopy (AFM), in which the mechanical transducer is integrated with near-field optical readout on a single chip. The motion of a nanoscale, doubly-clamped cantilever…
Tapping mode atomic force microscopy is a standard technique for inspection and analysis at the nanometer scale. The understanding of the non-linear dynamics of the system due to the tip sample interaction is an important prerequisite for a…
The capillary forces exerted by liquid drops and bubbles on a soft solid are directly measured using molecular dynamics simulations. The force on the solid by the liquid near the contact line is not oriented along the liquid vapor interface…
We perform simulations and experiments on an oscillating atomic force microscope cantilever approaching a surface, where the intermodulation response of the cantilever driven with two pure harmonic tones is investigated. In the simulations,…
The description of hydrodynamic interactions between a particle and the surrounding liquid, down to the nanometer scale, is of primary importance since confined liquids are ubiquitous in many natural and technological situations. In this…
We report on a proposal aimed at measuring the Casimir force in a cylinder-plane configuration. The Casimir force is evaluated including corrections due to finite parallelism, conductivity, and temperature. The range of validity of the…
We present theory and experiments for the force-distance curve $F(z_0)$ of an atomic force microscope (AFM) tip (radius $R$) indenting a supported fluid bilayer (thickness $2d$). For realistic conditions the force is dominated by the area…
We demonstrate coaxial atomic force microscope (AFM) tweezers that can trap and place small objects using dielectrophoresis (DEP). An attractive force is generated at the tip of a coaxial AFM probe by applying a radio frequency voltage…
An upper limit on the Casimir force is found using the dielectric functions of perfect crystalline materials which depend only on well defined material constants. The force measured with the atomic force microscope is larger than this limit…
The topography and the electrical properties are two crucial characteristics in determining roles and functionalities of materials. Conductive atomic force microscopy (CAFM) is widely recognized for its ability to independently measure the…