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Circuit discovery has recently attracted attention as a potential research direction to explain the non-trivial behaviors of language models. It aims to find the computational subgraphs, also known as circuits, within the model that are…
The Electron-Ion Collider (EIC) is a next-generation particle accelerator facility designed to probe the fundamental structure of matter such as the origins of nucleon mass, spin, and the dynamic behavior of quarks and gluons within nucleon…
We demonstrate the capabilities of a high temperature measurement set-up recently developed at our institute. It is dedicated to the characterization of semiconductor devices and test structures in the temperature range from room…
Quantum Diamond Microscope (QDM) magnetic field imaging is an emerging interrogation and diagnostic technique for integrated circuits (ICs). To date, the ICs measured with a QDM were either too complex for us to predict the expected…
A growing need exists for efficient and accurate methods for detecting defects in semiconductor materials and devices. These defects can have a detrimental impact on the efficiency of the manufacturing process, because they cause critical…
Advanced geometrical nanometrology is critical for process control in semiconductor manufacturing, supporting applications in, e.g., photonic integrated circuits, nanoelectronics, and emerging quantum and optoelectronic technologies.…
The majority of microelectromechanical system (MEMS) devices must be combined with integrated circuits (ICs) for operation in larger electronic systems. While MEMS transducers sense or control physical, optical or chemical quantities, ICs…
The Electron-ion collider in China (EicC) is a proposed future electron-ion collider designed to achieve a high luminosity, with a center-of-mass energy ranging from 15 to 20 GeV. Excellent particle identification (PID) with extensive…
Accurate characterization of silicon microstructures is essential for advancing microscale fabrication, quality control, and device performance. Traditional analysis using Scanning Electron Microscopy (SEM) often requires labor-intensive,…
The peculiarities of electric current in high-resistance materials, such as semiconductors or semimetals, irradiated by ion beams are considered. It is shown that after ion--beam irradiation an unusual electric current may arise directed…
The gamma-ray astronomical observatory INTEGRAL, succesfully launched on 17th October 2002, carries two large gamma-ray telescopes. One of them is the coded-mask imaging gamma-ray telescope onboard the INTEGRAL satellite (IBIS) which…
Superconducting NbN wires have recently received attention as detectors for visible and infrared photons. We present experiments in which we use a NbN wire for high-efficiency (40 %) detection of single electrons with keV energy. We use the…
Materials with heterogeneous structures exhibit complex physical processes such as delamination, cracks, and plasticity, which require micromechanical parameters for understanding. However, identifying these parameters is challenging due to…
How can we know whether new mechanistic interpretability methods achieve real improvements? In pursuit of lasting evaluation standards, we propose MIB, a Mechanistic Interpretability Benchmark, with two tracks spanning four tasks and five…
Research in semiconductor physics has advanced to the study of two-dimensional (2D) materials where the surface controls electronic transport. A scanning probe microscope (SPM) is an ideal tool to image electronic motion in these devices by…
The DIRC, a new type of Cherenkov imaging device, has been selected as the primary particle identification system for the BABAR detector at the asymmetric B-factory, PEP-II. It is based on total internal reflection and uses long,…
The Electron-Ion Collider (EIC) will be a novel experimental facility to explore the properties of gluons in nucleons and nuclei, shedding light on their structure and dynamics. The EIC community outlined the physics program of the EIC in a…
Ion Beam Analysis (IBA) is an established tool for material characterization, providing precise information on elemental composition, depth profiles, and structural information in the region near the surface of materials. However,…
The inductive response of an object to an oscillating magnetic field reveals information about its electrical conductivity and magnetic permeability. Here we introduce a technique that uses measurements of the angular, frequency and spatial…
Conventional silicon photomultipliers (SiPMs) are well established as light detectors with single-photon-detection capability and used throughout high energy physics, medical, and commercial applications. The possibility to produce single…