Related papers: Semiconductor characterization by scanning ion bea…
The Electron-Ion Collider (EIC) is a proposed machine to explore the behaviour of the fundamental particles and forces that bind atomic nuclei together. The design and construction of the EIC are underway at Brookhaven National Laboratory…
We propose a non-destructive means of characterizing a semiconductor wafer via measuring parameters of an induced quantum dot on the material system of interest with a separate probe chip that can also house the measurement circuitry. We…
A readout electronics used in space cosmic-ray charges measurement for multi-channel silicon detector and its performance test results are introduced in this paper. A 64-channel charge sensitive ASIC (VA140) from IDEAS company is adopt in…
Microwave impedance microscopy (MIM) is a near-field imaging technique that has been used to visualize the local conductivity of materials with nanoscale resolution across the GHz regime. In recent years, MIM has shown great promise for the…
Helium-ion beams (HIB) focused to sub-nanometer scales have emerged as powerful tools for high-resolution imaging as well as nano-scale lithography, ion milling or deposition. Quantifying irradiation effects is essential for reliable device…
The ePIC detector is being designed as a general-purpose detector to deliver the full physics program of the Electron-Ion Collider (EIC) in BNL USA. Particle Identification (PID) plays a crucial role in the EIC physics program. Over a wide…
Scanning ion microscopy applications of novel focused ion beam (FIB) systems based on ultracold rubidium (Rb) and cesium (Cs) atoms were investigated via ion-induced electron and ion yields. Results measured on the Rb$^+$ and Cs$^+$ FIB…
We implement the impedance measurement technique (IMT) for characterization of interferometer-type superconducting qubits. In the framework of this method, the interferometer loop is inductively coupled to a high-quality tank circuit. We…
Real-space mapping of doping concentration in semiconductor devices is of great importance for the microelectronic industry. In this work, a scanning microwave impedance microscope (MIM) is employed to resolve the local conductivity…
Iron with a large magnetic moment was widely believed to be harmful to the emergence of superconductivity because of the competition between the static ordering of electron spins and the dynamic formation of electron pairs (Cooper pairs).…
The Electron-Ion Collider (EIC) will provide a unique experimental platform to explore the properties of gluons in nucleons and nuclei, offering new insights into their structure and dynamics. The EIC community has outlined a detailed…
Semiconductor manufacturing is a complex, multistage process. Automated visual inspection of Scanning Electron Microscope (SEM) images is indispensable for minimizing equipment downtime and containing costs. Most previous research considers…
Scanning ion conductance microscopy (SICM) can image the surface topography of specimens in ionic solutions without mechanical probe--sample contact. This unique capability is advantageous for imaging fragile biological samples but its…
The IBIS telescope onboard INTEGRAL, the ESA gamma-ray space mission to be launched in 2002, is a soft gamma-ray (20 keV - 10 MeV) device based on a coded aperture imaging system. We describe here basic concepts of coded masks, the imaging…
Micromechanical constitutive parameters are important for many engineering materials, typically in microelectronic applications and material design. Their accurate identification poses a three-fold experimental challenge: (i) deformation of…
The focused ion beam (FIB) is a powerful tool for the fabrication, modification and characterization of materials down to the nanoscale. Starting with the gallium FIB, which was originally intended for photomask repair in the semiconductor…
Muon spin spectroscopy is one of the most powerful tools to investigate the microscopic properties of superconductors. In this manuscript, an overview on some of the main achievements obtained by this technique in the iron-based…
During the dielectric breakdown process of thin solid-state nanopores, the application of high voltages may cause the formation of multi-nanopores on one chip, which number and sizes are important for their applications. Here, simulations…
Internet of Things (IoT) devices have expanded the horizon of digital forensic investigations by providing a rich set of new evidence sources. IoT devices includes health implants, sports wearables, smart burglary alarms, smart thermostats,…
To cope with environments with high levels of radiation, non-silicon semiconductors such as silicon carbide detectors are being proposed for instrumentation. 4H-SiC diodes for radiation detection have been fabricated in the IMB-CNM Clean…