Related papers: Interference-aided spectrum fitting method for acc…
Diffraction of light beams from the phase steps due to the abrupt changes in the boundary of step leads to Fresnel fringes that their visibility and intensity profile depend on the change of the step height or light incident angle. The…
In this paper, we introduce a novel artificial neural network (ANN) based scheme to estimate the thickness of thin films deposited on a given substrate. Here we consider the visible interference pattern between a plane wave and a diverging…
We describe a high-speed interferometric method, using multiple angles of incidence and multiple wavelengths, to measure the absolute thickness, tilt, the local angle between the surfaces, and the refractive index of a fluctuating…
Dynamic thin film interferometry is a technique used to non-invasively characterize the thickness of thin liquid films. Recovering the underlying thickness from the captured interferograms, unconditionally and automatically is still an open…
We present a practical white-light interferometric method, supported by an open-source Python library \textit{optifik} for automated spectrum-to-thickness deduction, enabling foam film measurements down to a few nanometers. We describe…
In this paper, a thin film thickness gauge based on the interferometric principle of Y-shaped optical fiber is proposed to achieve accurate measurement of film thickness. In this paper, the optical fiber, the interferometric principle and…
When the thickness of the layer is smaller than the electrons mean free path, the morphology affects the conductivity directly based on the layer thickness. This issue provides basis in order to estimate the thickness of the layer by…
Spectroscopic ellipsometry is a powerful method with high surface sensitivity that can be used to monitor the growth of even sub-monolayer film. However, the analysis of ultrathin films is complicated by the correlation of the dielectric…
In semiconductor manufacturing processes, silicon dioxide films are commonly used as barrier layers, insulating layers, and protective layers. Coherence scanning interferometry (CSI) offers thin film thickness measurements with a…
Precise measurements of the geometrical thickness of a sample and its refractive index are important for materials science, engineering, and medical diagnosis. Among the possible non-contact evaluation methods, optical interferometric…
We present a robust, precise, and accurate method to simultaneously measure the refractive indices of two transparent materials within an interference coating. This is achieved by measuring both a photometrically accurate transmittance…
Thin film interferometry is a powerful technique for non-invasively measuring liquid film thickness with applications in ophthalmology, but its clinical translation is hindered by the challenges in reconstructing thickness profiles from…
High-precision surface roughness estimation plays an important role in many applications. However, the classical estimating methods are limited by shot noise and only can achieve the precision of 0.1 nm with white light interferometer.…
A simple method was developed to observe the interference patterns of the light reflected by the interfaces of thin liquid films. Employing a fluorescent microscope with epi-illumination, we collected the 2D patterns of interference fringes…
This paper presents two approaches to the precise design of maximally flat antireflection coatings reducing the reflectance of the substrate to near zero in a certain region around the central frequency. The first ideal case concerns…
In classical optical interferometry, loss and background complicate achieving fast nanometer-resolution measurements with illumination at low light levels. Conversely, quantum two-photon interference is unaffected by loss and background,…
We propose a theoretical study for Si thin film thickness measurement that is based on incident low energy electron beam on the film and counting the transmitted/incident electron fraction. It estimates the thin film thickness distribution…
To design semiconductor-based optical devices, the optical properties of the used semiconductor materials must be precisely measured over a large band. Transmission spectroscopy stands out as an inexpensive and widely available method for…
Spatial frequency filtering is a fundamental enabler of information processing methods in biological and technical imaging. Most filtering methods, however, require either bulky and expensive optical equipment or some degree of…
The quantum interference of two wavelength-entangled photons overlapping at a beamsplitter results in an oscillating interference pattern. The frequency of the beat note is dependent on the wavelength separation of the entangled photons but…