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We have developed an operando laser-based photoemission electron microscope (laser-PEEM) with a ferroelectric characterization system. A Sawyer-Tower circuit was implemented to measure the polarization-voltage ($P-V$) characteristics of…
Harnessing electron spin is crucial in developing energy-saving and high-speed devices for the next generation. In this scheme, visualizing spin-polarized electronic states aids in designing and developing new materials and devices.…
In the quest for dynamic multimodal probing of a material's structure and functionality, it is critical to be able to quantify the chemical state on the atomic and nanoscale using element specific electronic and structurally sensitive tools…
Ultra-fast transmission electron microscopy (UTEM) combines sub-picosecond time-resolution with the versatility of TEM spectroscopies. It allows one to study the dynamics of materials properties combining complementary techniques. However,…
Electroluminescence (EL) imaging is a powerful and established technique for assessing the quality of photovoltaic (PV) modules, which consist of many electrically connected solar cells arranged in a grid. The analysis of imperfect…
Probing optical excitations with nanometer resolution is important for understanding their dynamics and interactions down to the atomic scale. Electron microscopes currently offer the unparalleled ability of rendering spatially-resolved…
X-ray nanotomography is a powerful tool for the characterization of nanoscale materials and structures, but is difficult to implement due to competing requirements on X-ray flux and spot size. Due to this constraint, state-of-the-art…
Perhaps surprisingly, the total electron microscopy (EM) data collected to date is less than a cubic millimeter. Consequently, there is an enormous demand in the materials and biological sciences to image at greater speed and lower dosage,…
Correlative light-electron microscopy (CLEM) unifies the versatility of light microscopy (LM) with the high resolution of electron microscopy (EM), allowing one to zoom into the complex organization of cells. Most CLEM techniques use…
Quantum materials are driving a technology revolution in sensing, communication, and computing, while simultaneously testing many core theories of the past century. Materials such as topological insulators, complex oxides, quantum dots,…
This paper presents a comprehensive numerical analysis of super-resolution imaging using dielectric microparticles, employing the Finite-Difference Time-Domain (FDTD) method to elucidate the mechanisms that enable resolution enhancements…
In the last decade, the development of Ultrafast Electron Diffraction (UED) and Microscopy (UEM) has enabled the imaging of atomic motion in real time and space. These pivotal table-top tools opened the door for a vast range of applications…
Understanding and manipulating two-dimensional materials for real-world applications remains challenging due to a lack of effective and high-throughput characterization techniques. Soft X-ray time-of-flight photoemission electron microscopy…
To date, high-resolution electron microscopy has largely relied on using the phase of the exit wave function at the exit surface to form a high-resolution electron microscopic image. We have for the first time used chromatic aberration…
Transmission electron microscopy (TEM) is a powerful imaging tool that has found broad application in materials science, nanoscience and biology(1-3). With the introduction of aberration-corrected electron lenses, both the spatial…
Scanning electron microscopy (SEM) is the premier method for characterizing the nanoscale surface pores in ultrafiltration (UF) membranes and the support layers of reverse osmosis (RO) membranes. Based on SEM, the conventional understanding…
While transmission electron microscopes (TEM) can achieve a much higher resolution than optical microscopes, they face challenges of damage to samples during the high energy processes involved. Here, we explore using computational ghost…
The use of highly sensitive pixelated direct detectors has dramatically improved the performance of high energy instrumentation such as transmission electron microscopy. Here, we describe a recently developed monolithic active pixel sensor…
Spectroscopic photoemission microscopy is a well-established method to investigate the electronic structure of surfaces. In modern photoemission microscopes the electron optics allows imaging of the image plane, momentum plane, or…
Interaction-free measurement (IFM) has been proposed as a means of high-resolution, low-damage imaging of radiation-sensitive samples, such as biomolecules and proteins. The basic setup for IFM is a Mach-Zehnder interferometer, and recent…