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It has been shown that many of the phenomena related to the formation of "tails" in the low-concentration region of ion-implanted impurity distribution are due to the anomalous diffusion of nonequilibrium impurity interstitials. These…

Materials Science · Physics 2015-05-30 O. I. Velichko , A. P. Kavaliova

Modeling of ion-implanted boron redistribution in silicon crystals during low-temperature annealing with a small thermal budget has been carried out. It was shown that formation of "tails"' in the low-concentration region of impurity…

Materials Science · Physics 2015-06-05 O. I. Velichko , A. P. Kavaliova

A model of the interstitial diffusion of ion-implanted boron during rapid thermal annealing of silicon layers previously amorphized by implantation of germanium has been proposed. It is supposed that the boron interstitials are generated…

Materials Science · Physics 2009-05-01 O. I. Velichko , N. V. Kniazhava

A two stream model of boron diffusion in silicon has been developed. The model is intended for simulation of transient enhanced diffusion including redistribution of ion-implanted boron during low temperature annealing. The following…

Materials Science · Physics 2011-05-24 O. I. Velichko , A. A. Hundorina

It has been shown by means of impurity diffusion simulation that ion-implanted boron redistribution at the annealing temperatures 800^{\circ}C and lower is governed by the long-range migration of nonequilibrium impurity interstitials…

Materials Science · Physics 2011-06-27 O. I. Velichko , A. P. Kavaliova

Modeling of the long-range migration of boron interstitials during low temperature annealing of ion-implanted silicon crystals has been carried out.

Materials Science · Physics 2012-07-04 O. I. Velichko , A. P. Kavaliova

It has been shown that during thermal treatments of silicon layers preamorphized by germanium implantation and then implanted with boron ions the transport of impurity atoms occurs right up to a temperature of 850^{\circ}C due to migration…

Materials Science · Physics 2011-06-20 O. I. Velichko , A. A. Hundorina , V. V. Axenov

A theoretical investigation of the microscopic mechanisms provided the transient enhanced diffusion of boron atoms during rapid thermal annealing of silicon substrates doped by high fluence ion implantation was carried out. To compare the…

Mesoscale and Nanoscale Physics · Physics 2010-07-23 O. I. Velichko , A. A. Hundoryna

The mechanism underlying the long-range interstitial migration of nonequilibrium impurity interstitial species is used to simulate arsenic redistribution in ion implantation. An excellent agreement of the calculated arsenic concentration…

Materials Science · Physics 2015-06-11 O. I. Velichko

The analytical solutions of the equations describing impurity diffusion due to migration of nonequilibrium impurity interstitials were obtained for the impurity redistribution during ion implantation at elevated temperatures and for…

Materials Science · Physics 2008-02-24 O. I. Velichko , N. A. Sobolevskaya

Modeling of the phosphorus radiation-enhanced diffusion in the course of implantation of high-energy protons into an elevated-temperature silicon substrate and during its treatment in a hydrogen-containing plasma with addition of a…

Materials Science · Physics 2014-10-24 O. I. Velichko

To simulate the transient enhanced diffusion near the surface or interface, a set of equations describing the impurity diffusion and quasichemical reactions of dopant atoms and point defects in ion-implanted layers is proposed and analyzed.…

Materials Science · Physics 2007-05-23 O. I. Velichko , Yu. P. Shaman , A. K. Fedotov , A. V. Masanik

The model of hydrogen migration and of the reactions of hydrogen atoms with electrically active impurity, developed earlier, has been applied to simulate hydrogen diffusion and passivation process during plasma deuteration of silicon…

Materials Science · Physics 2015-06-12 O. I. Velichko , Yu. P. Shaman , A. P. Kovaliova

Boron implantation with in-situ dynamic annealing is used to produce highly conductive sub-surface layers in type IIa (100) diamond plates for the search of a superconducting phase transition. Here we demonstrate that high-fluence MeV…

Materials Science · Physics 2016-06-21 L. H. Willems van Beveren , R. Liu , H. Bowers , K. Ganesan , B. C. Johnson , J. C. McCallum , S. Prawer

Anomalous inter-layer atomic transport of deposited impurity atoms on Al(111) has been found by constant temperature molecular dynamics simulations. The low-energy deposition of Pt on Al(111) leads to oscillatory adsorbate-substrate…

Materials Science · Physics 2007-05-23 Péter Süle

Self-ion implantation amorphization is an established approach to study the structure and properties of amorphous silicon (a-Si). Fluctuation Electron Microscopy (FEM) has consistently observed Medium-Range Order (MRO) in this system that…

Materials Science · Physics 2025-07-28 J. M. Gibson , Robe Elliman , T. Susi , C. Mangler

Bipolar nanopores, with asymmetric charge distributions, can induce significant ionic current rectification (ICR) at ultra-short lengths, finding potential applications in nanofluidic devices, energy conversion, and other related fields.…

Chemical Physics · Physics 2024-10-29 Hongwen Zhang , Long Ma , Chao Zhang , Yinghua Qiu

We modify the theory of nanoscale patterns produced by ion bombardment with concurrent impurity deposition to take into account the effect that the near-surface impurities have on the collision cascades. As the impurity concentration is…

Materials Science · Physics 2016-05-04 R. Mark Bradley

(abridged) The polarized thermal radiation at far infrared and submillimeter wavelengths from dust grains in interstellar clouds with irregular magnetic fields is simulated. We show that the polarization properties of quiescent clouds and…

Astrophysics · Physics 2009-11-10 D. S. Wiebe , W. D. Watson

The bottleneck in achieving fully integrated silicon photonics lies in silicon-based light-emitting devices that are compatible with standard CMOS technology. Dislocation loops by implanting boron into silicon and annealing represents an…

Optics · Physics 2024-01-19 Xiaoming Wang , Jiajing He , Yaping Dan
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