Related papers: Improved Sputter Depth Resolution in Auger Thin Fi…
Under Display Cameras present a promising opportunity for phone manufacturers to achieve bezel-free displays by positioning the camera behind semi-transparent OLED screens. Unfortunately, such imaging systems suffer from severe image…
The Laue diffraction microscopy experiment uses the polychromatic Laue micro-diffraction technique to examine the structure of materials with sub-micron spatial resolution in all three dimensions. During this experiment, local…
X-ray photoelectron spectroscopy combined with Ar+ ion etching is a powerful concept to identify different chemical states of compounds in depth profiles, important for obtaining information underneath surfaces or at layer interfaces. The…
Orientation mapping is a widely used technique for revealing the microstructure of a polycrystalline sample. The crystalline orientation at each point in the sample is determined by analysis of the diffraction pattern, a process known as…
Recent advances in the area of plane segmentation from single RGB images show strong accuracy improvements and now allow a reliable segmentation of indoor scenes into planes. Nonetheless, fine-grained details of these segmentation masks are…
Recent studies reports that an epsilon-near-zero (ENZ) thin slab between a specimen and a substrate contributes in enhancing the spatial resolution of the optical system. Here, we investigate the ENZ thickness dependence of the resolution…
Active non-line-of-sight imaging systems are of growing interest for diverse applications. The most commonly proposed approaches to date rely on exploiting time-resolved measurements, i.e., measuring the time it takes for short light pulses…
Atomically thin films and surfaces exhibit many distinctive two-dimensional electronic properties that are absent in bulk crystals. In situ microscale multi-probe measurements have been utilized as an effective method to identify the…
Grazing incidence X-ray diffraction (GIXD) is widely used for the structural characterization of thin films, particularly for analyzing phase composition and the orientation distribution of crystallites. While various tools exist for…
Scanning electron microscopy (SEM) is indispensable in diverse applications ranging from microelectronics to food processing because it provides large depth-of-field images with a resolution beyond the optical diffraction limit. However,…
We present an algorithm to estimate fast and accurate depth maps from light fields via a sparse set of depth edges and gradients. Our proposed approach is based around the idea that true depth edges are more sensitive than texture edges to…
This work introduces an evaluation benchmark for depth estimation and completion using high-resolution depth measurements with angular resolution of up to 25" (arcsecond), akin to a 50 megapixel camera with per-pixel depth available.…
Co-sputtered Au-Ni thin films having thickness of 30 nm were deposited on Si(100) substrates and irradiated with 160 keV ^{40}Ar^{+} under ambient condition at a number of fluences and analyzed using Rutherford backscattering spectrometry…
Brownian thermal noise of thin-film coatings is a fundamental limit for high-precision experiments based on optical resonators such as gravitational-wave interferometers. Here we present the results of a research activity aiming to develop…
To design semiconductor-based optical devices, the optical properties of the used semiconductor materials must be precisely measured over a large band. Transmission spectroscopy stands out as an inexpensive and widely available method for…
Imaging and edge detection have been widely applied and played an important role in security checking and medical diagnosis. However, as we know, most edge detection based on ghost imaging system require a large measurement times and the…
We present an approach to depth estimation that fuses information from a stereo pair with sparse range measurements derived from a LIDAR sensor or a range camera. The goal of this work is to exploit the complementary strengths of the two…
A new approach was proposed to accurately determine the thickness of film, especially for ultra-thin film, through spectrum fitting with the assistance of interference layer. The determination limit can reach even less than 1 nm. Its…
High-resolution imaging in the terahertz (THz) spectral range remains fundamentally constrained by the limited numerical apertures of currently existing state-of-the-art imagers, which restricts its applicability across many fields, such as…
The goal of synthetic aperture imaging is to estimate the reflectivity of a remote region of interest by processing data gathered with a moving sensor which emits periodically a signal and records the backscattered wave. We introduce and…