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Forces induced by quantum fluctuations of electromagnetic field control adhesion phenomena between rough solids when the bodies are separated by distances ~10nm. However, this distance range remains largely unexplored experimentally in…

Mesoscale and Nanoscale Physics · Physics 2020-06-09 V. B. Svetovoy , A. V. Postnikov , I. V. Uvarov , F. I. Stepanov , G. Palasantzas

Detection of dynamic surface displacements associated with local changes in material strain provides access to a number of phenomena and material properties. Contact resonance-enhanced methods of Atomic Force Microscopy (AFM) have been…

Materials Science · Physics 2016-10-12 Nina Balke , Stephen Jesse , Pu Yu , Ben Carmichael , Sergei V. Kalinin , Alexander Tselev

Quantifying the tip-sample interaction at the nanoscale in Amplitude Modulation mode AFM is challenging, especially when measuring in liquids. Here, we derive formulas for the tip-sample conservative and dissipative interactions and…

Instrumentation and Detectors · Physics 2015-11-24 Luca Costa , Mario S Rodrigues

Using Atomic Force Microscopes (AFM) to manipulate nano-objects is an actual challenge for surface scientists. Basic haptic interfacesbetween the AFM and experimentalists have already been implemented. Themulti-sensory renderings (seeing,…

Graphics · Computer Science 2010-05-31 Sylvain Marliere , Daniela Urma , Jean-Loup Florens , Florence Marchi

We present a single-quadrature feedback scheme able to overcome the conventional 3 dB limit on parametric squeezing. The method is experimentally demonstrated in a micromechanical system based on a cantilever with a magnetic tip. The…

Mesoscale and Nanoscale Physics · Physics 2016-01-08 Andrea Vinante , Paolo Falferi

The dynamic behavior of AFM is studied taking into account the nonlinear interaction forces between probe and sample. The exerted forces on the free end of micro-beam are simulated with the third degree polynomial. The effect of some…

Applied Physics · Physics 2020-09-15 Sina Eftekhar , Seyyed Mostafa Mousavi Janbeh Sarayi

We report on progress in developing compact sensors for atomic force microscopy (AFM), in which the mechanical transducer is integrated with near-field optical readout on a single chip. The motion of a nanoscale, doubly-clamped cantilever…

Optics · Physics 2015-06-05 Yuxiang Liu , Houxun Miao , Vladimir Aksyuk , Kartik Srinivasan

A high sensitivity force sensor based on dielectric microspheres in vacuum, optically trapped by a single, upward-propagating laser beam, is described. Off-axis parabolic mirrors are used both to focus the 1064~nm trapping beam and to…

Instrumentation and Detectors · Physics 2020-09-10 Akio Kawasaki , Alexander Fieguth , Nadav Priel , Charles P. Blakemore , Denzal Martin , Giorgio Gratta

We present the design and experimental results of a near-field scanning microwave microscope (NSMM) working at a frequency of 1GHz. Our microscope is unique in that the sensing probe is separated from the excitation electrode to…

Materials Science · Physics 2009-11-13 K. Lai , M. B. Ji , N. Leindecker , M. A. Kelly , Z. X. Shen

We present a comprehensive method for visualisation and quantification of the magnetic stray field of magnetic force microscopy (MFM) probes, applied to the particular case of custom-made multi-layered probes with controllable high/low…

Frequency-modulation atomic force microscopy provides an outstanding precision of the measurement of chemical bonding forces. However, as the cantilever oscillates with an amplitude A that is usually on the order of atomic dimensions or…

Materials Science · Physics 2021-08-13 Ferdinand Huber , Franz J. Giessibl

We introduce "microdeflectometry", a novel technique for measuring the microtopography of specular surfaces. The primary data is the local slope of the surface under test. Measuring the slope instead of the height implies high information…

Optics · Physics 2009-11-13 Gerd Häusler , Claus Richter , Karl-Heinz Leitz , Markus C. Knauer

Molecular dynamics simulations are used to study contact between a rigid, nonadhesive, spherical tip with radius of order 30nm and a flat elastic substrate covered with a fluid monolayer of adsorbed chain molecules. Previous studies of bare…

Materials Science · Physics 2012-01-11 Shengfeng Cheng , Binquan Luan , Mark O. Robbins

We have realized a microstrip based THz near field cantilever which enables quantitative measurements of the impedance of the probe tip at THz frequencies (0.3 THz). A key feature is the on-chip balanced hybrid coupler which serves as an…

Atomic force microscopes have proved to be fundamental research tools in many situations where a gentle imaging process is required, and in a variety of environmental conditions, such as the study of biological samples. Among the possible…

Systems and Control · Computer Science 2023-01-05 Marco Coraggio , Martin Homer , Oliver D. Payton , Mario di Bernardo

We introduce a novel method to engineer sharply peaked, distance-selective interactions between neutral atoms by exploiting interaction-induced resonances within a resonantly driven Rydberg ladder system. By tuning laser parameters, a…

Atomic Physics · Physics 2025-07-24 Mohammadsadegh Khazali

We report on a traceable calibration system for a 3500mm-long console that carries a measurement system for inspecting the diameter of a circular reactor chassis. The system uses two single-pass laser interferometers with homodyne fringe…

Instrumentation and Detectors · Physics 2019-05-03 Simon Rerucha , Bretislav Mikel , Zdenek Matej , Ondrej Herman , Miroslava Hola , Michal Jelinek , Petr Jedlicka , Ondrej Cip , Josef Lazar

A spreadsheet algorithm is given for the atomic force microscope that accounts for non-linear behavior in the deflection of the cantilever and in the photo-diode response. In addition, the data analysis algorithm takes into account…

Soft Condensed Matter · Physics 2013-01-15 Phil Attard

The description of hydrodynamic interactions between a particle and the surrounding liquid, down to the nanometer scale, is of primary importance since confined liquids are ubiquitous in many natural and technological situations. In this…

The torsional vibration of atomic force microscope (AFM) cantilevers is critical for high-sensitivity measurements, yet existing models for width-varying cantilevers often rely on approximations that lead to significant discrepancies with…

Applied Physics · Physics 2025-11-25 Le Tri Dat , Nguyen Duy Vy