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Quantitative low-energy electron diffraction [LEED $I(V)$ or LEED $I(E)$, the evaluation of diffraction intensities $I$ as a function of the electron energy] is a versatile technique for the study of surface structures. The technique is…

Materials Science · Physics 2026-05-12 Alexander M. Imre , Lutz Hammer , Ulrike Diebold , Michele Riva , Michael Schmid

Ultrafast electron diffraction (UED) instruments typically operate at kHz or lower repetition rates and rely on indirect detection of electrons. However, these experiments encounter limitations because they are required to use electron…

Chemical Physics · Physics 2024-08-06 Fernando Rodriguez Diaz , Mark Mero , Kasra Amini

We demonstrate a new approach to classical fiber-fed spectroscopy. Our method is to use a photonic lantern that converts an arbitrary (e.g. incoherent) input beam into N diffraction-limited outputs. For the highest throughput, the number of…

Instrumentation and Methods for Astrophysics · Physics 2013-10-28 Christopher H. Betters , Sergio G. Leon-Saval , J. Gordon Robertson , Joss Bland-Hawthorn

I propose a spatial-mode demultiplexing (SPADE) measurement scheme for the far-field imaging of spatially incoherent optical sources. For any object too small to be resolved by direct imaging under the diffraction limit, I show that SPADE…

Optics · Physics 2017-03-01 Mankei Tsang

I present a semiclassical analysis of a spatial-mode demultiplexing (SPADE) measurement scheme for far-field incoherent optical imaging under the effects of diffraction and photon shot noise. Building on previous results that assume two…

Optics · Physics 2018-02-28 Mankei Tsang

Spatial-mode demultiplexing (SPADE) has recently been adopted to measure the separation in the transverse plane between two incoherent point-like sources. It has been argued that this approach may yield extraordinary performances in the…

An instrument has been developed for precision controlled exposures of electronic devices and material samples in particle beams. The instrument provides simultaneously a real time record of the profile of the beam and the fluence received.…

Instrumentation and Detectors · Physics 2020-12-03 M. R. Hoeferkamp , J. S. T. Wickramasinghe , A. Grummer , I. Rajen , S. Seidel

We have extended the range of the high-pressure optical spectroscopy to the far-infrared region keeping the accuracy of ambient-pressure experiments. The newly-developed method offers a powerful tool for the study of pressure-induced phase…

Strongly Correlated Electrons · Physics 2014-01-15 I. Kezsmarki , R. Gaal , C. C. Homes , B. Sipos , H. Berger , S. Bordacs , G. Mihaly , L. Forro

We describe a self calibrating optical technique that allows to perform absolute measurements of scattering cross sections for the light scattered at extremely small angles. Very good performances are obtained by using a very simple optical…

Optics · Physics 2009-11-10 Doriano Brogioli , Alberto Vailati , Marzio Giglio

High-resolution array detectors are widely used in single-particle tracking, but their performance is limited by excess noise from background light and dark current. As pixel resolution increases, the diminished signal per pixel exacerbates…

Quantum Physics · Physics 2025-12-16 Chao-Ning Hu , Jun Xin , Xiao-Ming Lu

A novel methodology, named the diffusion profile method, is proposed in this research to measure the electric field of a low gain avalanche detector (LGAD).The proposed methodology utilizes the maximum of the time derivative of the edge…

Instrumentation and Detectors · Physics 2023-11-30 Chenxi Fu , Haobo Wang , Tao Yang , Zijun Xu , Congcong Wang , Jianing Lin , Weimin Song , Ryuta Kiuchi , Xiaoshen Kang , Xin Shi , Suyu Xiao

Selene is the attempt to implement a new scheme for high-intensity specular reflectometry. Instead of a highly collimated beam one uses a convergent beam covering a large angular range. The angular resolution is then performed by a…

Instrumentation and Detectors · Physics 2011-02-15 J. Stahn , U. Filges , T. Panzner

The appearance of direct electron detectors marked a new era for electron diffraction. Their high sensitivity and low noise opens the possibility to extend electron diffraction from transmission electron microscopes (TEM) to lower energies…

Applied Physics · Physics 2025-02-18 Nikita Denisov , Andrey Orekhov , Johan Verbeeck

With the continuous advancement of laser technology, accurately evaluating the noise spectrum of high-performance lasers has become increasingly challenging. In this work, we demonstrate a high-precision laser spectrum analyzer based on the…

Optics · Physics 2025-05-28 Zhongwang Pang , Chunyi Li , Hongfei Dai , Wenlin Li , Dongqi Song , Fei Meng , Yige Lin , Bo Wang

The ability to resolve the dynamics of matter on its native temporal and spatial scales constitutes a key challenge and convergent theme across chemistry, biology, and materials science. The last couple of decades have witnessed ultrafast…

Millimetre-wave observations represent an important tool for Cosmology studies. The Line Intensity Mapping (LIM) technique has been proposed to map in three dimensions the specific intensity due to line (e.g. [CII], CO) emission, for…

Instrumentation and Methods for Astrophysics · Physics 2023-08-29 Usasi Chowdhury , Florence Levy-Bertrand , Martino Calvo , Johannes Goupy , Alessandro Monfardini

Recently, advancements in high-intensity laser technology have enabled the exploration of non-perturbative Quantum Electrodynamics (QED) in strong-field regimes. Notable aspects include non-linear Compton scattering and Breit-Wheeler pair…

Solid-state quantum light sources are being intensively investigated for applications in quantum technology. A key challenge is to extract light from host materials with high refractive index, where efficiency is limited by refraction and…

Optics · Physics 2023-10-11 S G Bishop , J K Cannon , H B Yagci , R N Clark , J P Hadden , W Langbein , A J Bennett

The formation of epitaxial graphene on SiC is monitored in-situ using low-energy electron diffraction (LEED). The possibility of using LEED as an in-situ thickness monitor of the graphene is examined. The ratio of primary diffraction spot…

Materials Science · Physics 2010-11-23 P. J. Fisher , Luxmi , N. Srivastava , S. Nie , R. M. Feenstra

We present spherical analysis of electron backscatter diffraction (EBSD) patterns with two new algorithms: (1) band localisation and band profile analysis using the spherical Radon transform; (2) orientation determination using spherical…

Materials Science · Physics 2019-09-04 Ralf Hielscher , Felix Bartel , Thomas Benjamin Britton
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