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Line Intensity Mapping (LIM) is a new observational technique that uses low-resolution observations of line emission to efficiently trace the large-scale structure of the Universe out to high redshift. Common mm/sub-mm emission lines are…
We present a pulsed laser deposition (PLD) system that can monitor growth by simultaneously using in situ optical spectroscopic ellipsometry (SE) and reflection high-energy electron diffraction (RHEED). The RHEED precisely monitors the…
The Spectral Energy Distribution (SED) mode of the Multiband Imaging Photometer for Spitzer (MIPS) Space Telescope provides low-spectral resolution (R ~ 15-25) spectroscopy in the far infrared using the MIPS 70 um detector. A reflective…
We have theoretically proposed a highly compact refractive-index sensor consisted of edge-cavity and line-defect waveguide in two-dimensional photonic crystal. The sensing object is completely outside of the single enclosed surface of the…
Precession Electron Diffraction (PED) offers a number of advantages for crystal structure analysis and solving unknown structures using electron diffraction. The current article uses many-beam simulations of PED intensities, in combination…
Electron diffraction through a thin patterned silicon membrane can be used to create complex spatial modulations in electron distributions by varying the intensity of different reflections using parameters such as crystallographic…
X-ray free electron lasers (XFELs) generate sequences of ultra-short, spatially coherent pulses of x-ray radiation. We propose the diffraction focusing spectrometer (DFS), which is able to measure the whole energy spectrum of the radiation…
The association of scanning transmission electron microscopy (STEM) and the detection of a diffraction pattern at each probe position (so-called 4D-STEM) represents one of the most promising approaches to analyze structural properties of…
The Laser-wire will be an essential diagnostic tool at the International Linear Collider. It uses a finely focussed laser beam to measure the transverse profile of electron bunches by detecting the Compton-scattered photons (or degraded…
Good optical transparency is a fundamental requirement of liquid scintillator (LS) detectors. Characterizing the transparency of a liquid scintillator to its own emitted light is a key parameter to determine the overall sensitivity of a…
A new method which enables us to estimate the inclination of Class I young stellar objects is proposed. Since Class I objects are not spherically symmetric, it is likely that the observed feature is sensitive to the inclination of the…
Precession of a converged beam during acquisition of a 4D-STEM dataset improves strain, orientation, and phase mapping accuracy by averaging over continuous angles of illumination. Precession experiments usually rely on integrated systems,…
In this paper, we show by experiment that by covering a thin flat nonlinear lens on the sources, the sub-diffraction-limit observation can be achieved by measuring either the near-field distribution or the far-field radiation of the sources…
Focused ion beams (FIBs) are widely used in nanofabrication for applications such as circuit repair, ultra-thin lamella preparation, strain engineering, and quantum device prototyping. Although the lateral spread of the ion beam is often…
We demonstrate a motion-free intensity diffraction tomography technique that enables direct inversion of 3D phase and absorption from intensity-only measurements for weakly scattering samples. We derive a novel linear forward model,…
This paper presents a new method to obtain the deformation distribution on the main reflector of an antenna only by measuring the electric intensity on a spherical surface with the focal point as the center of the sphere, regardless of…
We present a compact, cost-effective method for measuring the emittance of kHz-repetition-rate laser-wakefield accelerated electron beams using a permanent solenoid. The measured normalized emittance, $\epsilon_n = 124\,\mathrm{nm \cdot…
The electron optics of a 90 degree spherical deflecting analyzer (SDA-90) is investigated with an imaging matrix formalism. As a preanalyzer in the UTA-neutrino experiment, high transmission and reasonable energy resolution are the choices…
Microscopes and various forms of interferometers have been used for decades in optical metrology of objects that are typically larger than the wavelength of light {\lambda}. However, metrology of subwavelength objects was deemed impossible…
Recent advances in optical metasurfaces enable control of the wavefront, polarization and dispersion of optical waves beyond the capabilities of conventional diffractive optics. An optical design space that is poised to highly benefit from…