Related papers: Mapping Nanoscale Electromagnetic Near-Field Distr…
Various methods of force measurement with the Atomic Force Microscope (AFM) are compared for their ability to accurately determine the tip-surface force from analysis of the nonlinear cantilever motion. It is explained how intermodulation,…
Stepped well-ordered semiconductor surfaces are important as nanotemplates for the fabrication of one-dimensional nanostructures which are candidates of intriguing electronic properties. Therefore a detailed understanding of the underlying…
We experimentally show an all-optical multipolar decomposition of the lowest-order Eigenmodes of a single gold nanoprism using azimuthally and radially polarized cylindrical vector beams. By scanning the particle through these tailored…
The development of optical nanofibers (ONF) and the study and control of their optical properties when coupling atoms to their electromagnetic modes has opened new possibilities for their use in quantum optics and quantum information…
With increasing interest in utilizing nanostructures as nanoscale heat sources, the ability to precisely measure photothermal effects at the nanoscale has become increasingly significant. Techniques based on fluorescence or Raman signals…
Atomic Force Microscopy has enabled 2D imaging at the sub-molecular level, and 3D mapping of the potential field. However, fast identification of the surface still remains a challenging topic. In this paper, as a step towards implementation…
In this paper we present a new machine learning workflow with unsupervised learning techniques to identify domains within atomic force microscopy images obtained from polymer films. The goal of the workflow is to identify the spatial…
Using electrostatic coupling between an AFM tip and a metallic surface as a test interaction, we here present the measurement of the force between the tip and the surface, together with the measurement of the interaction stiffness and the…
We propose and evaluate a new type of optical force microscope based on a standing wave optical trap. Our microscope, calibrated in-situ and operating in a dynamic mode, is able to trap, without heating, a single metallic nanoparticle of…
Atomic Force Microscopy - Infrared (AFM-IR) spectroscopy allows spectroscopic studies in the mid-infrared spectral region with a spatial resolution better than 50 nm. We show that the high spatial resolution can be used to perform…
Optical tweezers and optical lattices are making it possible to control small particles by means of electromagnetic forces and torques. In this context, a method is presented in this work to calculate electromagnetic forces and torques for…
The ability to perform nanometer-scale optical imaging and spectroscopy is key to deciphering the low-energy effects in quantum materials, as well as vibrational fingerprints in planetary and extraterrestrial particles, catalytic…
Conventional dynamic atomic force microscopy (AFM) can be extended to bimodal and multimodal AFM in which the cantilever is simultaneously excited at two ore more resonance frequencies. Such excitation schemes result in one additional…
Focusing electromagnetic energy to sub-wavelength dimensions has become an increasingly active field of research for a variety of applications such as Heat Assisted Magnetic Recording (HAMR), nanolithography, and nanoscale optical…
Scattering scanning near-field optical microscopy (s-SNOM) is a technique to enhance the spatial resolution, and when combined by Fourier transform spectroscopy it can provide spectroscopic information with high spatial resolution. This…
The study of optical phenomena on the subwavelength scale is becoming increasingly important in photonics, particularly in the fields of nanoemitters, photonic crystals and plasmonics. Subwavelength field patterns are evanescent and must…
Analytical solution for optical trapping force on a spherical dielectric particle for an arbitrary positioned focused beam is presented in a generalized Lorenz-Mie and vectorial diffraction theory. In this case the exact electromagnetic…
We measure the modification of the transmission spectra of cold $^{87}$Rb atoms in the proximity of an optical nanofiber (ONF). Van der Waals interactions between the atoms an the ONF surface decrease the resonance frequency of atoms closer…
Tapping mode atomic force microscopy (AFM), also known as amplitude modulated (AM) or AC mode, is a proven, reliable and gentle imaging mode with widespread applications. Over the several decades that tapping mode has been in use,…
We demonstrate quantitative force imaging of long-range magnetic forces simultaneously with near-surface van-der-Waals and contact-mechanics forces using intermodulation atomic force microscopy. Magnetic forces at the 200 pN level are…