Related papers: Mapping Nanoscale Electromagnetic Near-Field Distr…
Many nanophotonic applications require precise control and characterization of electromagnetic field properties at the nanoscale. The chiral properties of the field are among its key characteristics, yet measurement of optical chirality at…
Using Atomic Force Microscopes (AFM) to manipulate nano-objects is an actual challenge for surface scientists. Basic haptic interfacesbetween the AFM and experimentalists have already been implemented. Themulti-sensory renderings (seeing,…
Traction Force Microscopy (TFM) computes the forces exerted at the surface of an elastic material by measuring induced deformations in volume. It is used to determine the pattern of the adhesion forces exerted by cells or by cellular…
When subjected to monochromatic incident light a nanoparticle will emit light which then interferes with the incident beam. With sufficient contrast and sufficiently close to the particle this interference pattern may be recorded with a…
Near-field microscopy is widely used for characterizing electromagnetic fields at nanoscale, where nanoprobes afford the opportunity to extract subwavelength optical quantities, including the amplitude, phase, polarization and chirality.…
The functional properties of many technological surfaces in biotechnology, electronics, and mechanical engineering depend to a large degree on the individual features of their nanoscale surface texture, which in turn are a function of the…
We use an atomic force microscope (AFM) to manipulate graphene films on a nanoscopic length scale. By means of local anodic oxidation with an AFM we are able to structure isolating trenches into single-layer and few-layer graphene flakes,…
We present a detailed theoretical study of the recent proposal for selective nanomanipulation of nanometric particles above a substrate using near-field optical forces [Chaumet {\it et al.} Phys. Rev. Lett. {\bf 88}, 123601 (2002)].…
To achieve quantitative interpretation of Piezoresponse Force Microscopy (PFM), including resolution limits, tip bias- and strain-induced phenomena and spectroscopy, analytical representations for tip-induced electroelastic fields inside…
Controlling optical fields on the subwavelength scale is at the core of any nanophotonic device. Of particular interest are nanophotonic particle accelerators that promise a compact alternative to conventional radiofrequency-based…
We introduce a method for analyzing the physical properties of nanoparticles in fluids via the competition between viscous drag and optical forces. By flowing particles through a microfluidic device containing an optical microcavity which…
Atomic Force Microscopy - Infrared (AFM-IR) has emerged as a useful technique for measuring absorption spectra with spatial resolution better than the optical diffraction limit. The technique relies on the movement of a probe for atomic…
Sub-nm resolution images can be achieved by Atomic Force Microscopy (AFM) on samples that are deposited on hard substrates. However, it is still extremely challenging to image soft interfaces, such as biological membranes, due to the…
The interaction of swift, free-space electrons with confined optical near fields has recently sparked much interest. It enables a new type of photon-induced near-field electron microscopy, mapping local optical near fields around…
Piezoelectric nanowires are promising materials for sensing, actuation and energy harvesting, due to their enhanced properties at the nanoscale. However, quantitative characterization of piezoelectricity in nanomaterials is challenging due…
The controllable positioning of a vacuum-levitated object near a material surface is of importance for studying short-range forces, such as Casimir forces, interfacial friction forces, or gravity in yet unexplored parameter regimes. Here we…
The calculation of optical force density distribution within a material is challenging at the nanoscale, where quantum and non-local effects emerge and macroscopic parameters such as permittivity become ill-defined. We demonstrate that the…
In this article, we present a deflection measurement setup for Atomic Force Microscopy (AFM). It is based on a quadrature phase differential interferometer: we measure the optical path difference between a laser beam reflecting above the…
Understanding the nanoscale carrier dynamics induced by light excitation is the key to unlocking futuristic devices and innovative functionalities in advanced materials. Optical pump-probe scanning tunneling microscopy (OPP-STM) has opened…
Contact electrification (CE) remains a critical challenge in advanced material technologies where uncontrolled surface charging can compromise manufacturability, reliability, and performance in practical applications. Ultrathin glass with…