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Related papers: Thickness Estimation of the Si Thin Films: a Simul…

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The extremely low dark current of silicon carbide (SiC) detectors, even after high-fluence irradiation, was utilized to develop a beam monitoring system for a wide range of particle rates, i.e., from the kHz to the GHz regime. The system is…

Instrumentation and Detectors · Physics 2024-03-20 Simon Waid , Andreas Gsponer , Jürgen Maier , Philipp Gaggl , Richard Thalmeier , Thomas Bergauer

We describe an alternating current method to measure the Nernst effect in superconducting thin films at low temperatures. The Nernst effect is an important tool in the understanding superconducting fluctuations and, in particular, vortex…

Superconductivity · Physics 2020-10-28 Yuxiao Wu , Aviad Frydman , Arnab Roy

To optimize electron energy toward in-situ imaging large bio-samples up to 10-um thickness with nanoscale resolution, we implemented an analytical model based on elastic and inelastic characteristic angles [1]. This model can be used to…

Applied Physics · Physics 2023-12-27 Xi Yang , Victor Smaluk , Timur Shaftan

Terahertz time-domain conductivity measurements in 2 to 100 nm thick iron films resolve the femtosecond time delay between applied electric fields and resulting currents. This response time decreases for thinner metal films. The macroscopic…

The problem of determining the porous silicon (PSi) optical constants, thickness, porosity, and surface quality using just reflectance data is board employing evolutionary algorithms. The reflectance measurements were carried out of PSi…

Materials Science · Physics 2018-09-12 C. F. Ramirez-Gutierrez , J. D. Castaño-Yepes , M. E. Rodriguez-Garcia

We study an interface between two media separated by a strictly 2D sheet. We show how the amplitude reflection coefficient can be modeled by that for an interface where the 2D sheet has been replaced by a film of small but finite thickness.…

Mesoscale and Nanoscale Physics · Physics 2012-09-21 Bo E. Sernelius

A simple electronic experiment with a field effect transistor type microstructure is suggested. The thin superconductor layer is the source-drain channel of the layered structure where an AC current is applied. It is necessary to measure…

Superconductivity · Physics 2009-09-29 Todor Mishonov , Martin Stoev

Superconducting microwave resonators have recently gained a primary importance in the development of cryogenic applications, such as circuit quantum electrodynamics, electron spin resonance spectroscopy and particles detection for…

The low-temperature electrical resistivity of corrugated semiconductor films is theoretically considered. Nanoscale corrugation enhances the electron-electron scattering contribution to the resistivity, resulting in a stepwise resistivity…

Mesoscale and Nanoscale Physics · Physics 2015-05-13 Shota Ono , Hiroyuki Shima

We present our work on High Energy Material detection based on thin film of Lithium using the phenomenon of Optical Pumping. The Li atoms present in the thin film are optically pumped to one of the ground hyperfine energy levels so that…

Atomic Physics · Physics 2014-12-10 Sachin Barthwal , Ashok V. S

In this paper we study kinetics of spreading of thin liquid films on solid interfaces. We present an overview of current experimental picture and discuss available theoretical approaches and their limitations. We report some new…

Condensed Matter · Physics 2007-05-23 S. F. Burlatsky , A. M. Cazabat , M. Moreau , G. Oshanin , S. Villette

The conductivity of organic semiconductors is measured {\it in-situ} and continuously with a bottom contact configuration, as a function of film thickness at various gate voltages. The depletion layer thickness can be directly determined as…

Materials Science · Physics 2009-11-10 Manabu Kiguchi , Manabu Nakayama , Toshihiro Shimada , Koichiro Saiki

We report investigation of ferromagnetic resonance phenomenon in ferromagnetic thin films with essentially non-uniform composition. Epitaxial Pd-Fe thin film with linear distribution of Fe content across the thickness is used as the model…

This work reports a systematic study of the evolution of charge transport mechanism in granular ultra-thin films of palladium of thickness varying between 6nm and 2nm. While the films with thickness > 4nm exhibit metallic behaviour, that at…

Specific heat of polycrystalline BaTiO3 thin films on the fused quartz substrate was measured by ac-hot probe method. Phase transition temperature, excess entropy and spontaneous polarization were determined as a function of film thickness…

Materials Science · Physics 2007-05-23 B. A. Strukov , S. T. Davitadze , S. G. Shulman , B. M. Goltzman , V. V. Lemanov

Boron carbide thin films of different thicknesses deposited by ion beam sputtering were studied. The deposited films were characterized by grazing incidence hard x-ray reflectivity (GIXR), resonant soft x-ray reflectivity (RSXR), x-ray…

Materials Science · Physics 2017-08-25 P. N. Rao , R. K. Gupta , K. Saravanan , A. Bose , S. C. Joshi , T. Ganguli , S. K. Rai

We present a theoretical study of electron-phonon scattering effects in thin films made of a strong topological insulator. Phonons are modelled by isotropic elastic continuum theory with stress-free boundary conditions, and the interaction…

Mesoscale and Nanoscale Physics · Physics 2012-01-26 Sébastien Giraud , Arijit Kundu , Reinhold Egger

The challenge of imaging low-density objects in an electron microscope without causing beam damage is significant in modern TEM. This is especially true for life science imaging, where the sample, rather than the instrument, still…

Optics · Physics 2025-01-29 Francisco Vega Ibáñez , Jo Verbeeck

We study the critical behavior of magnetic thin films as a function of the film thickness. We use the ferromagnetic Ising model with the high-resolution multiple histogram Monte Carlo (MC) simulation. We show that though the 2D behavior…

Materials Science · Physics 2007-12-20 X. T. Pham Phu , V. Thanh Ngo , H. T. Diep

Thin films of $\alpha$-MoGe show progressively reduced $T_{c}$'s as the thickness is decreased below 30 nm and the sheet resistance exceeds 100 $\Omega/\Box$. We have performed far-infrared transmission and reflection measurements for a set…

Superconductivity · Physics 2009-11-13 H. Tashiro , J. M. Graybeal , D. B. Tanner , E. J. Nicol , J. P. Carbotte , G. L. Carr