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Within (semi-)automated visual inspection, learning-based approaches for assessing visual defects, including deep neural networks, enable the processing of otherwise small defect patterns in pixel size on high-resolution imagery. The…
In manufacture, steel and other metals are mainly cut and shaped during the fabrication process by computer numerical control (CNC) machines. To keep high productivity and efficiency of the fabrication process, engineers need to monitor the…
This paper reports on experiments realized on several IBM 5Q chips which show evidence for the advantage of using error detection and fault-tolerant design of quantum circuits. We show an average improvement of the task of sampling from…
It has been observed that particular rate-1/2 partially systematic parallel concatenated convolutional codes (PCCCs) can achieve a lower error floor than that of their rate-1/3 parent codes. Nevertheless, good puncturing patterns can only…
Surface defect detection plays a critical role in industrial quality inspection. Recent advances in artificial intelligence have significantly enhanced the automation level of detection processes. However, conventional semantic segmentation…
At advanced process nodes, lithography weakpoints can exist in physical layouts of integrated circuit designs even if the layouts pass design rule checking (DRC). Existence of lithography weakpoints in a physical layout can cause…
Defects in semiconductor crystals can have significant detrimental effects on their performance as radiation detectors. Defects cause charge trapping and recombination, leading to lower signal amplitudes and poor energy resolution. We have…
In recent years, 3D point clouds (PCs) have gained significant attention due to their diverse applications across various fields, such as computer vision (CV), condition monitoring (CM), virtual reality, robotics, autonomous driving, etc.…
High quality, fully-programmable quantum processors are available with small numbers (<1000) of qubits, and the scientific potential of these near term machines is not well understood. If the small number of physical qubits precludes…
Numerous image processing techniques (IPTs) have been employed to detect crack defects, offering an alternative to human-conducted onsite inspections. These IPTs manipulate images to extract defect features, particularly cracks in surfaces…
Machine learning classification systems are susceptible to poor performance when trained with incorrect ground truth labels, even when data is well-curated by expert annotators. As machine learning becomes more widespread, it is…
Photovoltaic cells are electronic devices that convert light energy to electricity, forming the backbone of solar energy harvesting systems. An essential step in the manufacturing process for photovoltaic cells is visual quality inspection…
Recognition of objects with subtle differences has been used in many practical applications, such as car model recognition and maritime vessel identification. For discrimination of the objects in fine-grained detail, we focus on deep…
It has been a widely growing interest in using silicon carbide (SiC)in high-power electronic devices. Yet, SiC wafers may contain killer defects that could reduce fabrication yield and make the device fall into unexpected failures. To…
Software quality is one of the essential aspects of a software. With increasing demand, software designs are becoming more complex, increasing the probability of software defects. Testers improve the quality of software by fixing defects.…
Detecting surface anomalies of industrial materials poses a significant challenge within a myriad of industrial manufacturing processes. In recent times, various methodologies have emerged, capitalizing on the advantages of employing a…
Due to the complicated nanoscale structures of current integrated circuits(IC) builds and low error tolerance of IC image segmentation tasks, most existing automated IC image segmentation approaches require human experts for visual…
In this paper, we introduce the problem of simultaneously detecting multiple photographic defects. We aim at detecting the existence, severity, and potential locations of common photographic defects related to color, noise, blur and…
In post-silicon validation, tuning is to find the values for the tuning knobs, potentially as a function of process parameters and/or known operating conditions. In this sense, an more efficient tuning requires identifying the most critical…
Quantum computing testbeds exhibit high-fidelity quantum control over small collections of qubits, enabling performance of precise, repeatable operations followed by measurements. Currently, these noisy intermediate-scale devices can…