English

CSE: Surface Anomaly Detection with Contrastively Selected Embedding

Computer Vision and Pattern Recognition 2024-03-05 v1

Abstract

Detecting surface anomalies of industrial materials poses a significant challenge within a myriad of industrial manufacturing processes. In recent times, various methodologies have emerged, capitalizing on the advantages of employing a network pre-trained on natural images for the extraction of representative features. Subsequently, these features are subjected to processing through a diverse range of techniques including memory banks, normalizing flow, and knowledge distillation, which have exhibited exceptional accuracy. This paper revisits approaches based on pre-trained features by introducing a novel method centered on target-specific embedding. To capture the most representative features of the texture under consideration, we employ a variant of a contrastive training procedure that incorporates both artificially generated defective samples and anomaly-free samples during training. Exploiting the intrinsic properties of surfaces, we derived a meaningful representation from the defect-free samples during training, facilitating a straightforward yet effective calculation of anomaly scores. The experiments conducted on the MVTEC AD and TILDA datasets demonstrate the competitiveness of our approach compared to state-of-the-art methods.

Keywords

Cite

@article{arxiv.2403.01859,
  title  = {CSE: Surface Anomaly Detection with Contrastively Selected Embedding},
  author = {Simon Thomine and Hichem Snoussi},
  journal= {arXiv preprint arXiv:2403.01859},
  year   = {2024}
}

Comments

9 pages, VISAPP 2024 conference

R2 v1 2026-06-28T15:08:06.793Z