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Tapping mode atomic force microscopy is a standard technique for inspection and analysis at the nanometer scale. The understanding of the non-linear dynamics of the system due to the tip sample interaction is an important prerequisite for a…
We demonstrate a dynamic scanning capacitance microscope (DSCM) that operates at large bandwidths, cryogenic temperatures and high magnetic fields. The setup is based on a non-contact atomic force microscope (AFM) with a quartz tuning fork…
Atomic force spectroscopy and microscopy (AFM) are invaluable tools to characterize nanostructures and biological systems. Most experiments, including state-of-the-art images of molecular bonds, are achieved by driving probes at their…
Magnetic resonance imaging (MRI) revolutionized diagnostic medicine and biomedical research by allowing a noninvasive access to spin ensembles. To enhance MRI resolution to the nanometer scale, new approaches including scanning probe…
The local magnetic field in a Penning-Malmberg trap is found by measuring the temperatures that result when electron plasmas are illuminated by microwaves pulses. Multiple heating resonances are observed as the pulse frequencies are swept.…
A sensitive photoacoustic detection approach employing a silicon cantilever is investigated for power measurement of electromagnetic radiation. The technique which is actuated by pressure waves generated through radiation-induced heat,…
Atomic Force Microscopy (AFM) has become established as a powerful and a versatile tool for investigating local mechanical properties. In addition, it has been made possible to take advantage of the AFM tip-sample interaction, to perturb,…
This article reviews the progress of atomic force microscopy (AFM) in ultra-high vacuum, starting with its invention and covering most of the recent developments. Today, dynamic force microscopy allows to image surfaces of conductors…
Atomic force microscopy (AFM) is an analytical surface characterization tool which can reveal a sample's topography with high spatial resolution while simultaneously probing tip-sample interactions. Local measurement of chemical properties…
Magnetic force microscopy (MFM) is long established as a powerful tool for probing the local manifestation of magnetic nanostructures across a range of temperatures and applied stimuli. A major drawback of the technique, however, is that…
Moir\'e physics plays an important role for the characterization of functional materials and the engineering of physical properties in general, ranging from strain-driven transport phenomena to superconductivity. Here, we report the…
Magnetic Resonance Imaging (MRI) is universally acknowledged as an excellent tool to extract detailed spatial information with minimally invasive measurements. Efforts toward ultra-low-field (ULF) MRI are made to simplify the scanners and…
In atomic force microscopy (AFM), the exchange and alignment of the AFM cantilever with respect to the optical beam and position-sensitive detector (PSD) are often performed manually. This process is tedious and time-consuming and sometimes…
Understanding the complex properties of electronic and spintronic devices at the micro- and nano-scale is a topic of intense current interest as it becomes increasingly important for scientific progress and technological applications.…
We present a design for a tunneling-current-assisted scanning near-field microwave microscope. For stable operation at cryogenic temperatures, making a small and rigid microwave probe is important. Our coaxial resonator probe has a length…
Conventional dynamic atomic force microscopy (AFM) can be extended to bimodal and multimodal AFM in which the cantilever is simultaneously excited at two ore more resonance frequencies. Such excitation schemes result in one additional…
Micro-focused X-ray beams produced by third generation synchrotron sources offer new perspective of studying strains and processes at nanoscale. Atomic force microscope setup combined with a micro-focused synchrotron beam allows precise…
Frequency dependent dynamic behavior in Piezoresponse Force Microscopy (PFM) implemented on a beam-deflection atomic force microscope (AFM) is analyzed using a combination of modeling and experimental measurements. The PFM signal comprises…
We describe our research programme on the use of atomic magnetometers to detect conductive objects via electromagnetic induction. The extreme sensitivity of atomic magnetometers at low frequencies, up to seven orders of magnitude higher…
Magnetic resonance imaging, based on the manipulation and detection of nuclear spins, is a powerful imaging technique that typically operates on the scale of millimeters to microns. Using magnetic resonance force microscopy, we have…