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The dynamic behavior of AFM is studied taking into account the nonlinear interaction forces between probe and sample. The exerted forces on the free end of micro-beam are simulated with the third degree polynomial. The effect of some…

Applied Physics · Physics 2020-09-15 Sina Eftekhar , Seyyed Mostafa Mousavi Janbeh Sarayi

We consider a simple version of a cyclic adiabatic inversion (CAI) technique in magnetic resonance force microscopy (MRFM). We study the problem: What component of the spin is measured in the CAI MRFM? We show that the non-destructive…

Quantum Physics · Physics 2009-11-07 G. P. Berman , F. Borgonovi , H. S. Goan , S. A. Gurvitz , V. I. Tsifrinovich

In this work, we report the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM). The HIM is a powerful instrument, capable of sub-nanometer resolution imaging and machining of nanoscale structures, while the…

Instrumentation and Detectors · Physics 2020-04-02 Santiago H. Andany , Gregor Hlawacek , Stefan Hummel , Charlène Brillard , Mustafa Kangül , Georg E. Fantner

Intermodulation atomic force microscopy (IMAFM) is a dynamic mode of atomic force microscopy (AFM) with two-tone excitation. The oscillating AFM cantilever in close proximity to a surface experiences the nonlinear tip-sample force which…

Mesoscale and Nanoscale Physics · Physics 2013-02-08 Daniel Platz , Erik A. Tholen , Carsten Hutter , Arndt C. von Bieren , David B. Haviland

Various methods of force measurement with the Atomic Force Microscope (AFM) are compared for their ability to accurately determine the tip-surface force from analysis of the nonlinear cantilever motion. It is explained how intermodulation,…

Mesoscale and Nanoscale Physics · Physics 2013-03-12 Daniel Platz , Daniel Forchheimer , Erik A. Tholén , David B. Haviland

Continuous-wave electrically detected magnetic resonance (cw-EDMR or just EDMR) and its variants are powerful tools to investigate spin-dependent processes in materials and devices. The use of quadrature detection improves the quality and…

Reliable operation of frequency modulation mode atomic force microscopy (FM-AFM) depends on a clean resonance of an AFM cantilever. It is recognized that the spurious mechanical resonances which originate from various mechanical components…

Mesoscale and Nanoscale Physics · Physics 2024-03-12 Yoichi Miyahara , Harrisonn Griffin , Antoine Roy-Gobeil , Ron Belyansky , Hadallia Bergeron , José Bustamante , Peter Grutter

We describe here the implementation of an interferometer-based microwave impedance microscope on a home-built tuning-fork based scanning probe microscope (SPM). Tuning-fork based SPMs, requiring only two electrical contacts for…

Applied Physics · Physics 2020-07-14 Z. Liu , P. W. Krantz , V. Chandrasekhar

Single-spin detection is one of the important challenges facing the development of several new technologies, e.g. single-spin transistors and solid-state quantum computation. Magnetic resonance force microscopy with a cyclic adiabatic…

Atomic force microscopy (AFM) with molecule-functionalized tips has emerged as the primary experimental technique for probing the atomic structure of organic molecules on surfaces. Most experiments have been limited to nearly planar…

We report a Kelvin probe force microscopy (KPFM) implementation using the dissipation signal of a frequency modulation atomic force microscopy that is capable of detecting the gradient of electrostatic force rather than electrostatic force.…

Mesoscale and Nanoscale Physics · Physics 2017-04-21 Yoichi Miyahara , Peter Grutter

We demonstrate coaxial atomic force microscope (AFM) tweezers that can trap and place small objects using dielectrophoresis (DEP). An attractive force is generated at the tip of a coaxial AFM probe by applying a radio frequency voltage…

Instrumentation and Detectors · Physics 2015-05-18 K. A. Brown , J. A. Aguilar , R. M. Westervelt

Atomic force microscope (AFM) generally works on the basis of manipulating absolute magnitude of van der Waals (vdW) force between the tip and specimen. The force is, however, less sensitive to alternation of atom species than to tip-sample…

Magneto-acoustic tomography combines near-field radio-frequency (RF) and ultrasound with the aim of creating a safe, high resolution, high contrast hybrid imaging technique. We present continuous-wave magneto-acoustic imaging techniques,…

Medical Physics · Physics 2016-11-17 Miaad S. Aliroteh , Greig C. Scott , Amin Arbabian

An atomic force microscope (AFM) is capable of producing ultra-high resolution measurements of nanoscopic objects and forces. It is an indispensable tool for various scientific disciplines such as molecular engineering, solid-state physics,…

Applications · Statistics 2017-06-28 Bryan Yates , Aleksander Labuda , Martin Lysy

A number of aspects of magnetic force microscopy (MFM) specific to the imaging of hard magnetic films have been studied. Firstly, we show that topographic images made in tapping mode with probes characterized by the moderate cantilever…

Materials Science · Physics 2015-11-02 G Ciuta , F Dumas-Bouchiat , Nora Dempsey , Olivier Fruchart

Combining electron paramagnetic resonance (EPR) with scanning tunneling microscopy (STM) enables detailed insight into the interactions and magnetic properties of single atoms on surfaces. A requirement for EPR-STM is the efficient coupling…

Mesoscale and Nanoscale Physics · Physics 2020-01-15 T. S. Seifert , S. Kovarik , C. Nistor , L. Persichetti , S. Stepanow , P. Gambardella

Coherent spin resonance methods, such as nuclear magnetic resonance and electron spin resonance spectroscopy, have led to spectrally highly sensitive, non-invasive quantum imaging techniques. Here, we propose a pump-probe spin resonance…

Quantum Physics · Physics 2024-12-02 Philipp Haslinger , Stefan Nimmrichter , Dennis Rätzel

Sub-nm resolution images can be achieved by Atomic Force Microscopy (AFM) on samples that are deposited on hard substrates. However, it is still extremely challenging to image soft interfaces, such as biological membranes, due to the…

Atomic force microscopy (AFM) is a powerful tool to investigate interaction forces at the micro and nanoscale. Cantilever stiffness, dimensions and geometry of the tip can be chosen according to the requirements of the specific application,…

Applied Physics · Physics 2020-07-31 M. Chighizola , L. Puricelli , L. Bellon , A. Podestà
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