Related papers: A White Light Interferometric Microscope for Measu…
Integrated optics are used to achieve astronomical interferometry inside robust and compact materials, improving the instruments stability and sensitivity. In order to perform differential phase measurements at the H$\alpha$ line (656.3 nm)…
Concentration gradients at the microscale play a central role in many physical, chemical, and biological systems, yet their quantitative visualization remains challenging due to the limited optical contrast associated with changes in…
Structured illumination microscopy (SIM) is a very important super-resolution microscopy technique, which provides high speed super-resolution with about two-fold spatial resolution enhancement. Several attempts aimed at improving the…
A modified weak measurement scheme, rotatory biased weak measurement, is proposed to significantly improve the sensitivity and resolution of the refractive index sensor on a total reflection structure. This method introduces an additional…
The acquisition of accurately coloured, balanced images in an optical microscope can be a challenge even for experienced microscope operators. This article presents an entirely automatic mechanism for balancing the white level that allows…
Using the Cryogenic, High-Accuracy Refraction Measuring System (CHARMS) at NASA's Goddard Space Flight Center, we have measured the absolute refractive index of five specimens taken from a very large boule of Corning 7980 fused silica from…
Conventional spectrometer and polarimeter systems rely on bulky optics, fundamentally limiting compact integration and hindering multi-dimensional optical sensing capabilities. Here, we propose a spectropolarimeter enabled by…
Broadband mid-infrared (mid-IR) spectroscopy applications could greatly benefit from today's well-developed, highly scalable silicon photonics technology; however, this platform lacks broadband transparency due to its reliance on absorptive…
Infrared (IR) imaging has become a viable tool for visualizing various chemical bonds in a specimen. The performance, however, is limited in terms of spatial resolution and imaging speed. Here, instead of measuring the loss of the IR beam,…
Digital holographic microscopy (DHM) applied to quantitative phase imaging (QPI) has been successfully demonstrated as a powerful label-free method to analyse the optical properties of cells. Spatially multiplexed interferometric microscopy…
We demonstrate volumetric fluorescence lifetime microscopy (FLIM) using the electro-optic FLIM technique. Images acquired in a selective plane illumination microscope are gated using a Pockels cell driven at 80 MHz, enabling light sheet…
Si-based photodetectors satisfy the criteria of low-cost and environmental-friendly, and can enable the development of on-chip complementary metal-oxide-semiconductor (CMOS)-compatible photonic systems. However, extending their…
It has been recently demonstrated that integrated optics could enhance accuracy, stability, and ease of use of stellar interferometry techniques. The subject of this thesis is the study of an optical component based on singlemode waveguides…
The refractive index of novel organosilica (nano/micro)material is determined using two methods. The first method is based on analysis of optical extinction efficiency of organosilica beads versus wavelength, which is obtained by a standard…
On-chip integration of two-dimensional (2D) materials offers great potential for the realization of novel optoelectronic devices in different photonic platforms. In particular, indium selenide (InSe) is a very promising 2D material due to…
We uncover and identify the regime for a magnetically and ferroelectrically controllable negative refraction of light traversing multiferroic, oxide-based metastructure consisting of alternating nanoscopic ferroelectric (SrTiO$_2$) and…
We demonstrate experimentally the realization and the characterization of a chip scale integrated photodetector for the visible and the near infrared spectral regime based on the integration of a MoSe2/WS2 heterojunction on top of a silicon…
The amplification obtained using weak values is quantified through a detailed investigation of the signal to noise ratio for an optical beam deflection measurement. We show that for a given deflection, input power and beam radius, the use…
We review our recent progresses on frequency conversion in integrated devices, focusing primarily on experiments based on strip-loaded and quantum-well intermixed AlGaAs waveguides, and on CMOS-compatible high-index doped silica glass…
Far Infrared interferometry is the main diagnostics method for electron density measurements in medium sized tokamaks. The transverse density gradients of plasma produce refractive effect, and the probing radiation does not propagate along…