Related papers: A White Light Interferometric Microscope for Measu…
The increasing demand for optical technologies with dynamic spectral control has driven interest in chromogenic materials, particularly for applications in tunable infrared metasurfaces. Phase-change materials such as vanadium dioxide and…
We calculate the intensity and photon spectrum of the intergalactic background light (IBL) as a function of redshift using an approach based on observational data obtained in many different wavelength bands from local to deep galaxy…
The density of two-dimensional Ag adatom gases on W(110) is determined by monitoring local electron reflectivity using low energy electron microscopy (LEEM). This method of adatom concentration measurement can detect changes in adatom…
This paper intends to realize negative refraction with absorption suppressed by the electromagneticly induced transparency(EIT) in a dense four-level atomic system. Without the two equal transition frequencies responding to the probe field,…
The dispersive behavior of materials with atomic charge numbers varing from $Z = 4$ (beryllium, Be) to $Z = 82$ (lead, Pb) was investigated experimentally and theoretically at $\gamma$-ray energies up to 2 MeV. The experiment was performed…
Shaping single-mode operation in high-power fibres requires a precise knowledge of the gain-medium optical properties. This requires accurate measurements of the refractive index differences ($\Delta$n) between the core and the cladding of…
Broadband absorption in the visible spectrum is essential in optoelectronic applications that involve power conversion such as photovoltaics and photocatalysis. Most ultrathin broadband absorbers use parasitic plasmonic structures that…
It is shown that reflective laser refractometery at Brewster angle can be usefull for precision measurements of refractive indexes (RI) in the transparency band of various films of nanoscale thickness. The RI measurements of nanoscale…
White light interferometry (WLI) can be used to obtain surface morphology information on dimensional scale of millimeters with lateral resolution as good as ~1 {\mu}m and depth resolution down to 1 nm. By performing true three-dimensional…
White-light interferometry is one of today's most precise tools for determining optical material properties. Achievable precision and accuracy are typically limited by systematic errors due to a high number of interdependent data fitting…
We present Large Inverse Rendering Model (LIRM), a transformer architecture that jointly reconstructs high-quality shape, materials, and radiance fields with view-dependent effects in less than a second. Our model builds upon the recent…
Total internal reflection microscopy (TIRM) measures changes in the distance between a colloidal particle and a transparent substrate by measuring the intensity of light scattered by the particle when it is illuminated by the evanescent…
Reliable control of the deposition process of optical films and coatings frequently requires monitoring of the refractive index profile throughout the layer. In the present work a simple in situ approach is proposed which uses a WKBJ matrix…
Theory of light absorption and circular photocurrent in Weyl semimetals is developed for arbitrary large light intensities with account for both elastic and inelastic relaxation processes of Weyl fermions. The direct optical transition rate…
Adaptive optics (AO) is a powerful image correction technique with proven benefits for many life-science microscopy methods. However, the complexity of adding a reflective wavefront modulator and a wavefront sensor into already complicated…
The Wavelength-shifting Optical Module (WOM) is a novel optical sensor that uses wavelength shifting and light guiding to substantially enhance the photosensitive area of UV optical modules. It has been designed for the IceCube Upgrade, a…
Reflective ptychography is a promising lensless imaging technique with a wide field of view, offering significant potential for applications in semiconductor manufacturing and detection. However, many semiconductor materials are coated with…
Refractive index enhancement is crucial in the field of lithography, imaging, optical communications, solar devices and many more. We present a review of advancements in the process of designing high refractive index metamaterials, starting…
Dark Field X-ray Microscopy (DFXM) has advanced 3D non-destructive, high-resolution imaging of strain and orientation in crystalline materials, enabling the study of embedded structures in bulk. However, the photon-intensive nature of…
Real-space mapping of doping concentration in semiconductor devices is of great importance for the microelectronic industry. In this work, a scanning microwave impedance microscope (MIM) is employed to resolve the local conductivity…